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DS3631N Datasheet(PDF) 4 Page - National Semiconductor (TI) |
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DS3631N Datasheet(HTML) 4 Page - National Semiconductor (TI) |
4 / 8 page Test Circuits (Continued) TLF5816 – 10 Each input is tested separately FIGURE 2 IIH TLF5816 – 11 Note A Each input is tested separately Note B When testing DS1633 and DS1634 input not under test is grounded For all other circuits it is at VCC FIGURE 3 IIL TLF5816 – 12 Both gates are tested simultaneously FIGURE 4 ICC for AND and NAND Circuits Schematic Diagram (Equivalent Circuit) TLF5816 – 15 4 |
Similar Part No. - DS3631N |
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Similar Description - DS3631N |
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