(2 Places)

49.9

Ω ± 1% (2 Places)

YP

YM

100%

80%

20%

0%

0 V

0 V

(a) SCHEMATIC

(b) WAVEFORMS

NOTE A: The lumped instrumentation capacitance for any

single-ended voltage measurement is less than or equal

to 10 pF. When making measurements at YP or YM, the

complementary output is similarly loaded.

NOTE A: The worst-case test pattern produces nearly the maximum switching frequency for all of the LVDS outputs. Pattern with

CLKSEL low shown.

CLKIN

Even Dn

Odd Dn

SN65LVDS93

PARAMETER MEASUREMENT INFORMATION (continued)

Figure 3. Test Load and Voltage Definitions for LVDS Outputs

Figure 4. Worst-Case Test Pattern (CLKSEL Low Shown)

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