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LM3212 Datasheet(PDF) 2 Page - Texas Instruments

Part # LM3212
Description  Step-Down DC-DC Converter
Download  25 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

LM3212 Datasheet(HTML) 2 Page - Texas Instruments

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D4
D3
D2
A4
A3
A2
C4
A1
B4
D1
C1
B1
C3
B3
C2
B2
PVIN
EN
PVIN
ACB
PACB
VCON
FB
ACB
PACB
PGND
SW
VDD
AUTO_BY
SW
SGND
PGND
D1
D2
D3
A1
A2
A3
C1
A4
B1
D4
C4
B4
C2
B2
C3
B3
EN
PVIN
VDD
ACB
PACB
SW
PGND
ACB
PACB
FB
VCON
PVIN
SW
AUTO_BY
PGND
SGND
LM3212
SNOSB37C – DECEMBER 2008 – REVISED APRIL 2013
www.ti.com
Connection Diagrams
16-Bump 0.5 mm DSBGA Package, Large Bump
Top View
Bottom View
PIN DESCRIPTIONS
Pin #
Name
Description
A3, A4
PVIN
Power Supply Voltage Input to the internal PFET switch.
A2
VDD
Analog Supply Input.
A1
EN
Enable Input. Set this digital input high for normal operation. For shutdown, set low. Pin has an 800 k
internal pulldown resistor.
B4, B3
SW
Switching Node connection to the internal PFET switch and NFET synchronous rectifier. Connect to an
inductor.
B1
VCON
Voltage Control Analog input. VCON controls VOUT in PWM mode. When VCON < 0.15V the switches are
turned off (output in tri-state).
B2
AUTO_BY
The AUTO_BY Pin determines the bypass mode function. Set AUTO_BY high for normal automatic bypass
mode operation. Set AUTO_BY low for forced bypass (independent of the state of the EN pin). The pin has an
internal 800 k
Ω pullup resistor.
C4, C3
PGND
Power Ground
C2
SGND
Analog and Control Ground
C1
FB
Feedback Analog Input. Connect to the output at the output filter capacitor.
D3, D2
ACB
Active Current Assist source/sink and Bypass. Connect to the output at the output filter capacitor.
D4, D1
PACB
Power-to-active current/bypass circuit.
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
2
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Copyright © 2008–2013, Texas Instruments Incorporated
Product Folder Links: LM3212


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