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LM26LV Datasheet(PDF) 4 Page - Texas Instruments |
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LM26LV Datasheet(HTML) 4 Page - Texas Instruments |
4 / 33 page Example: 2 to 3 Battery Cells VDD Supply (+1.6V to +5.5V) GND VDD OVERTEMP OVERTEMP VTEMP TRIP TEST Microcontroller LM26LV Analog ADC Input LM26LV SNIS144F – JULY 2007 – REVISED FEBRUARY 2013 www.ti.com Typical Application These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. Absolute Maximum Ratings (1) Supply Voltage −0.3V to +6.0V Voltage at OVERTEMP pin −0.3V to +6.0V Voltage at OVERTEMP and VTEMP pins −0.3V to (VDD + 0.5V) TRIP TEST Input Voltage −0.3V to (VDD + 0.5V) Output Current, any output pin ±7 mA Input Current at any pin(2) 5 mA Storage Temperature −65°C to +150°C Maximum Junction Temperature, TJ(MAX) +155°C Human Body Model 4500V ESD Susceptibility(3) Machine Model 300V Charged Device Model 1000V For soldering specifications: see product folder at www.ti.com and http://www.ti.com/lit/SNOA549 (1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions. (2) When the input voltage (VI) at any pin exceeds power supplies (VI < GND or VI > VDD), the current at that pin should be limited to 5mA. (3) The Human Body Model (HBM) is a 100pF capacitor charged to the specified voltage then discharged through a 1.5k Ω resistor into each pin. The Machine Model (MM) is a 200pF capacitor charged to the specified voltage then discharged directly into each pin. The Charged Device Model (CDM) is a specified circuit characterizing an ESD event that occurs when a device acquires charge through some triboelectric (frictional) or electrostatic induction processes and then abruptly touches a grounded object or surface. Operating Ratings (1) Specified Temperature Range: TMIN ≤ TA ≤ TMAX LM26LV/LM26LV-Q1 −50°C ≤ TA ≤ +150°C Supply Voltage Range (VDD) +1.6 V to +5.5 V Thermal Resistance ( θJA) (2) WSON-6 (Package NGF0006A) 152 °C/W (1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions. (2) The junction to ambient temperature resistance ( θJA) is specified without a heat sink in still air. 4 Submit Documentation Feedback Copyright © 2007–2013, Texas Instruments Incorporated Product Folder Links: LM26LV |
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