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LM2590HV

SNVS084C – DECEMBER 2001 – REVISED JULY 2016

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Copyright © 2001–2016, Texas Instruments Incorporated

(1)

All limits specified at room temperature and at temperature extremes. All room temperature limits are 100% production tested. All limits

at temperature extremes are specified via correlation using standard Statistical Quality Control (SQC) methods. All limits are used to

calculate Average Outgoing Quality Level (AOQL).

(2)

Typical numbers are at 25°C and represent the most likely norm.

(3)

The switching frequency is reduced when the second stage current limit is activated. The amount of reduction is determined by the

severity of current overload.

(4)

No diode, inductor or capacitor connected to output pin.

(5)

Feedback pin removed from output and connected to 0 V to force the output transistor switch ON.

(6)

Feedback pin removed from output and connected to 12 V for the 3.3-V, 5-V, and the ADJ version to force the output transistor switch

OFF.

6.5 Electrical Characteristics

PARAMETER

TEST CONDITIONS

UNIT

Feedback bias current

Adjustable version only,

10

50

nA

100

127

150

173

kHz

110

173

Saturation voltage

1.2

0.95

1.3

V

DC

100%

0%

Switch current limit

1.3

1.9

2.8

A

1.2

3

Output leakage current

(4) (6)

Output = 0 V

50

µA

Output =

−1 V

5

30

mA

Operating quiescent current

5

10

mA

Standby quiescent current

SD/SS pin = 0 V,

90

200

µA

250

SHUTDOWN AND SOFT-START CONTROL (see Test Circuits)

Shutdown threshold voltage

1.3

V

Low (shutdown mode)

0.6

High (soft-start mode)

2

Soft-start voltage

2

V

3

Shutdown current

5

10

µA

Soft-start current

1.5

5

µA

FLAG AND DELAY CONTROL (see Test Circuits)

Regulator dropout detector threshold

voltage

Low (flag ON)

92%

96%

98%

0.7

0.3

1

V

Flag output leakage current

0.3

µA

Delay pin threshold voltage

Low (flag ON)

1.21

1.25

mV

1.25

1.29

Delay pin source current

3

6

mV

Delay pin saturation

Low (flag ON)

70

350

mV

400