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DS96F175MJ-QMLV Datasheet(PDF) 4 Page - Texas Instruments |
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DS96F175MJ-QMLV Datasheet(HTML) 4 Page - Texas Instruments |
4 / 14 page DS96F173MQML, DS96F175MQML SNOSAS9A – APRIL 2011 – REVISED APRIL 2013 www.ti.com These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. Absolute Maximum Ratings (1) Storage Temperature Range(TStg) −65°C ≤ TA ≤ +175°C Lead Temperature (Soldering, 60 sec.) 300°C Max. Package Power Dissipation at 25°C(2) CDIP (NFE) 1,500 mW CDIP (NAD) 1,034 mW LCCC (NAJ) 1,500 mW Supply Voltage 7.0V Input Voltage, A or B Inputs ±25V Differential Input Voltage ±25V Enable Input Voltage 7.0V Low Level Output Current 50 mA (1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the Electrical Characteristics--DC Parameters. The ensured specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions. (2) Above TA = 25°C derate NFE package 10 mW/°C, NAD package 6.90 mW/°C, NAJ package 11.11 mW/°C. Recommended Operating Conditions Min Max Units Supply Voltage (VCC) 4.50 5.50 V Common Mode Input Voltage (VCM) −7 +12 V Differential Input Voltage (VID) −7 +12 V Output Current HIGH (IOH) −400 μA Output Current LOW (IOL) 16 mA Operating Temperature (TA) −55 125 °C Quality Conformance Inspection Mil-Std-883, Method 5005 - Group A Subgroup Description Temp (°C) 1 Static tests at +25 2 Static tests at +125 3 Static tests at -55 4 Dynamic tests at +25 5 Dynamic tests at +125 6 Dynamic tests at -55 7 Functional tests at +25 8A Functional tests at +125 8B Functional tests at -55 9 Switching tests at +25 10 Switching tests at +125 11 Switching tests at -55 12 Settling time at +25 13 Settling time at +125 14 Settling time at -55 4 Submit Documentation Feedback Copyright © 2011–2013, Texas Instruments Incorporated Product Folder Links: DS96F173MQML DS96F175MQML |
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