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DS90LV032AW-MLS Datasheet(PDF) 3 Page - Texas Instruments

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Part # DS90LV032AW-MLS
Description  3V LVDS Quad CMOS Differential Line Receiver
Download  16 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

DS90LV032AW-MLS Datasheet(HTML) 3 Page - Texas Instruments

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DS90LV032AQML
www.ti.com
SNLS205A – NOVEMBER 2011 – REVISED APRIL 2013
Absolute Maximum Ratings
(1)
Supply Voltage (VCC)
−0.3V to +4V
Input Voltage (RI+, RI−)
−0.3V to +3.9V
Enable Input Voltage (En, En*)
−0.3V to (VCC + 0.3V)
Output Voltage (RO)
−0.3V to (VCC + 0.3V)
Storage Temperature Range
−65°C ≤ TA ≤ +150°C
Lead Temperature Range
(Soldering 4 sec.)
+260°C
Maximum Package Power Dissipation @ +25°C (2)
NAD0016A Package
845 mW
NAC0016A Package
845 mW
Thermal Resistance
θJA
NAD0016A Package
148°C/W
NAC0016A Package
148°C/W
θJC
NAD0016A Package
21°C/W
NAC0016A Package
21°C/W
Maximum Junction Temperature
+150°C
ESD Rating (3)
4.5 KV
(1)
“Absolute Maximum Ratings” indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the
Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may
degrade when the device is not operated under the listed test conditions.
(2)
Derate @ 6.8mW/°C
(3)
Human body model, 1.5 k
Ω in series with 100 pF.
Recommended Operating Conditions
Min
Max
Unit
Supply Voltage (VCC)
+3.15
+3.45
V
Receiver Input Voltage
Gnd
+3.0
V
Operating Free Air
Temperature (TA)
−55
+85
°C
Quality Conformance Inspection
Mil-Std-883, Method 5005 - Group A
Subgroup
Description
Temp °C
1
Static tests at
+25
2
Static tests at
+125
3
Static tests at
-55
4
Dynamic tests at
+25
5
Dynamic tests at
+125
6
Dynamic tests at
-55
7
Functional tests at
+25
8A
Functional tests at
+125
8B
Functional tests at
-55
9
Switching tests at
+25
10
Switching tests at
+125
11
Switching tests at
-55
12
Settling time at
+25
13
Settling time at
+125
14
Settling time at
-55
Copyright © 2011–2013, Texas Instruments Incorporated
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