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BQ500414QRGZRQ1 Datasheet(PDF) 5 Page - Texas Instruments |
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BQ500414QRGZRQ1 Datasheet(HTML) 5 Page - Texas Instruments |
5 / 34 page bq500414Q www.ti.com SLUSBE4B – JANUARY 2014 – REVISED JUNE 2014 Pin Functions (continued) PIN I/O DESCRIPTION NAME NUMBER I_SENSE 42 I Transmitter input current, used for parasitic loss calculations. Use 40-m Ω sense resistor and A = 50 gain current sense amp LOSS_THR 43 I Input to program FOD/PMOD thresholds and FOD_CAL correction LED_MODE 44 I LED Mode Select V_SENSE 45 I Transmitter power train input voltage, used for FOD and Loss calculations. Unused 46 I This pin can be either connected to GND or left open. Connecting to GND can improve layout grounding GND 47 — GND ADCREF 48 I External reference voltage input. Connect this input to GND. EPAD 49 — Flood with copper GND plane and stitch vias to PCB internal GND plane 7 Specifications 7.1 Absolute Maximum Ratings (1) over operating free-air temperature range (unless otherwise noted) MIN MAX UNIT Voltage applied at V33D to DGND –0.3 3.6 Voltage applied at V33A to AGND –0.3 3.6 V Voltage applied to any pin(2) –0.3 3.6 (1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) All voltages referenced to GND. 7.2 Handling Ratings MIN MAX UNIT Tstg Storage temperature range –40 150 °C Human-Body Model (HBM)(2) 2 2 kV V(ESD) (1) Charged-Device Model (CDM)(3) 750 750 kV (1) Electrostatic discharge (ESD) to measure device sensitivity and immunity to damage caused by assembly line electrostatic discharges in to the device. (2) Level listed above is the passing level per ANSI, ESDA, and JEDEC JS-001. JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. (3) Level listed above is the passing level per EIA-JEDEC JESD22-C101. JEDEC document JEP157 states that 250-V CDM allows manufacturing without risk of damaging the device with a standard ESD control process. Copyright © 2014, Texas Instruments Incorporated Submit Documentation Feedback 5 Product Folder Links: bq500414Q |
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