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SLUS497A – SEPTEMBER 2001 – REVISED MARCH 2010

ABSOLUTE MAXIMUM RATINGS

(1)

VALUE

UNIT

–0.3 to 7

V

V

Operating ambient temperature

–20 to 70

°C

Storage temperature

–40 to 125

°C

Soldering temperature (10 s max.)

260

°C

(1)

Permanent device damage may occur if Absolute Maximum Ratings are exceeded. Functional operation should be limited to the

Recommended DC Operating Conditions detailed in this data sheet. Exposure to conditions beyond the operational limits for extended

periods of time may affect device reliability.

DC THRESHOLDS

(1)

PARAMETER

TEST CONDITIONS

TYPICAL

TOLERANCE

UNIT

Temperature cutoff

Voltage at the TS pin

±5%

V

High-temperature fault

Voltage at the TS pin

±5%

V

Low-temperature fault

Voltage at the TS pin

±5%

V

Maximum cell voltage

Voltage at the BAT pin

2.00

±2.5%

V

Minimum cell voltage

Voltage at the BAT pin

950

±5%

mV

TS input change for

ΔT/Δt detection

Voltage at the TS pin

±25%

V/min

High threshold at SNS

Voltage at the SNS pin

50

±10

mV

Low threshold at SNS

Voltage at the SNS pin

–50

±10

mV

Sleep-mode input threshold

Voltage at the BAT pin

±0.5

V

(1)

RECOMMENDED DC OPERATING CONDITIONS

over operating free-air temperature range (unless otherwise noted)

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Supply voltage

4

5

6

V

Supply current

Exclusive of external loads

0.5

1

mA

Sleep current

5

µA

Thermistor input

0.5

VCC

V

Output high input

V

Output low input

0.2

V

High-impedance leakage current

LED

5

µA

Sink current

MOD, LED

20

mA

Charge timer resistor

2

250

k

Ω

Charge timer capacitor

0.001

1

µF

IMPEDANCE

PARAMETER

MIN

TYP

MAX

UNIT

Battery input impedance

10

M

Ω

TS input impedance

10

M

Ω

SNS input impedance

10

M

Ω

TIMING

PARAMETER

MIN

TYP

MAX

UNIT

MTO time-base variation

–5%

5%

Pulse-trickle frequency

0.9

1

1.1

Hz

Copyright © 2001–2010, Texas Instruments Incorporated

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