SN74LVTH18512-EP datasheet(4/38 Pages) TI1

Part #	SN74LVTH18512-EP

Description	3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

Download	38 Pages

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Manufacturer	TI1 [Texas Instruments]

Direct Link	http://www.ti.com

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SN74LVTH18512EP, SN74LVTH182512EP

3.3V ABT SCAN TEST DEVICES

WITH 18BIT UNIVERSAL BUS TRANSCEIVERS

SCBS790 − NOVEMBER 2003

4

POST OFFICE BOX 655303

• DALLAS, TEXAS 75265

functional block diagram

2A1

1D

C1

1D

C1

1D

C1

1D

C1

Boundary-Control

Register

Bypass Register

Identification

Register

Boundary-Scan Register

Instruction

Register

TAP

Controller

2LEBA

2CLKBA

2OEBA

TDI

TMS

TCK

2B1

TDO

2OEAB

2LEAB

2CLKAB

1A1

1D

C1

1D

C1

1D

C1

1D

C1

1LEBA

1CLKBA

1OEBA

1B1

1OEAB

1LEAB

1CLKAB

VCC

One of Nine Channels

2

1

3

63

64

62

4

29

30

28

36

35

37

16

34

32

33

61

49

31

VCC

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