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ADC12DL040 Datasheet(PDF) 10 Page - Texas Instruments |
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ADC12DL040 Datasheet(HTML) 10 Page - Texas Instruments |
10 / 37 page VA AGND To Internal Circuitry I/O ADC12DL040 SNAS250D – FEBRUARY 2005 – REVISED APRIL 2013 www.ti.com AC Electrical Characteristics Unless otherwise specified, the following specifications apply for AGND = DGND = DR GND = 0V, VA = VD = +3.0V, VDR = +2.5V, PD = 0V, External VREF = +1.0V, fCLK = 40 MHz, fIN = 10 MHz, tr = tf = 2 ns, CL = 15 pF/pin, Duty Cycle Stabilizer On, parallel output mode. Boldface limits apply for TJ = TMIN to TMAX: all other limits TJ = 25°C (1) (2) (3) (4) Typical Limits Units Symbol Parameter Conditions (5) (5) (Limits) fCLK1 Maximum Clock Frequency 40 MHz (min) fCLK2 Minimum Clock Frequency 10 MHz tCH Clock High Time Duty Cycle Stabilizer On 12.5 5 ns (min) tCL Clock Low Time Duty Cycle Stabilizer On 12.5 5 ns (min) tr, tf Clock Rise and Fall Times Duty Cycle Stabilizer On 2 4 ns (max) tCH Clock High Time Duty Cycle Stabilizer Off 12.5 10 ns (min) tCL Clock Low Time Duty Cycle Stabilizer Off 12.5 10 ns (min) tr, tf Clock Rise and Fall Times Duty Cycle Stabilizer Off 2 ns (max) tCONV Conversion Latency Parallel mode 7 Clock Cycles 3.5 ns (min) Data Output Delay after Rising Clock tOD Parallel mode 6.0 Edge 9.6 ns (max) tCONV Conversion Latency Multiplex mode, Channel A 7.5 Clock Cycles tCONV Conversion Latency Multiplex mode, Channel B 8 Clock Cycles 3.5 ns (min) tOD Data Output Delay after Clock Edge Multiplex mode 6.0 9 ns (max) tSKEW ABb to Data Skew ±0.5 ns (max) tAD Aperture Delay 2 ns tAJ Aperture Jitter 1.2 ps rms tDIS Data outputs into Hi-Z Mode 10 ns tEN Data Outputs Active after Hi-Z Mode 10 ns 1.0 µF on pins 4, 14; 0.1 µF on pins tPD Power Down Mode Exit Cycle 5,6,12,13; 10 µF between pins 5, 6 and 1 µs between pins 12, 13 (1) The inputs are protected as shown below. Input voltage magnitudes above VA or below GND will not damage this device, provided current is limited per Note 4 under Absolute Maximum Ratings. However, errors in the A/D conversion can occur if the input goes above VA or below GND by more than 100 mV. As an example, if VA is +3.3V, the full-scale input voltage must be ≤+3.4V to ensure accurate conversions. (2) To specify accuracy, it is required that |VA–VD| ≤ 100 mV and separate bypass capacitors are used at each power supply pin. (3) With the test condition for VREF = +1.0V (2VP-P differential input), the 12-bit LSB is 488 µV. (4) Timing specifications are tested at TTL logic levels, VIL = 0.4V for a falling edge and VIH = 2.4V for a rising edge. (5) Typical figures are at TJ = 25°C, and represent most likely parametric norms. Test limits are specified to TI's AOQL (Average Outgoing Quality Level). 10 Submit Documentation Feedback Copyright © 2005–2013, Texas Instruments Incorporated Product Folder Links: ADC12DL040 |
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