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LE28DW1621T Datasheet(PDF) 2 Page - Sanyo Semicon Device |
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LE28DW1621T Datasheet(HTML) 2 Page - Sanyo Semicon Device |
2 / 20 page 2 16 Megabit FlashBank Memory LE28DW1621T-80T (Draft3) 2 SANYO Electric Co.,Ltd. Semiconductor Company 1-1-1 Sakata Oizumi Gunma Japan R.1.20(4/27/2000) No.xxxx-2/20 The Auto Low Power Mode automatically puts the LE28DW1621T in a near standby mode after data has been accessed with a valid Read operation. This reduces the IDD active read current from typically 10mA to typically 5µA. The Auto Low Power mode reduces the typical IDD active read current to the range of 1mA/MHz of Read cycle time. If a concurrent Read while Write is being performed, the IDD is reduced to typically 40mA. The device exits the Auto Low Power mode with any address transition or control signal transition used to initiate another Read cycle, with no access time penalty. Read The Read operation of the LE28DW1621T Flash banks is controlled by CE# and OE#, a chip enable and output enable both have to be low for the system to obtain data from the outputs. OE# is the output control and is used to gate data from the output pins. The data bus is in high impedance state when OE# is high. Refer to the timing waveforms for further details (Figure 3). When the read operation is executed without address change after power switch on, CE# should be changed the level high to low. If the read operation is executed after programing , CE# should be changed the level high to low. Write All Write operations are initiated by first issuing the Software Data Protect (SDP) entry sequence for Chip, Block, or Sector Erase. Word Program in the selected Flash bank. Word Program and all Erase commands have a fixed duration, that will not vary over the life of the device, i.e., are independent of the number of Erase/Program cycles endured. Either Flash bank may be read to another Flash Bank during the internally controlled write cycle. The device is always in the Software Data Protected mode for all Write operations Write operations are controlled by toggling WE# or CE#. The falling edge of WE# or CE#, whichever occurs last, latches the address. The rising edge of WE# or CE#, whichever occurs first, latches the data and initiates the Erase or Program cycle. For the purposes of simplification, the following descriptions will assume WE# is toggled to initiate an Erase or Program. Tog- gling the applicable CE# will accomplish the same function. (Note, there are separate timing diagrams to illustrate both WE# and CE# controlled Program or Write commands.) Word Program The Word Program operation consists of issuing the SDP Word Program command, initiated by forcing CE# and WE# low, and OE# high. The words to be programmed must be in the erased state, prior to programming. The Word Program command programs the desired addresses word by word. During the Word Program cycle, the addresses are latched by the falling edge of WE#. The data is latched by the rising edge of WE#. ( See Figure 4-1 for WE# or 4-2 for CE# controlled Word Program cycle timing waveforms, Table 3 for the command sequence, and Figure 15 for a flowchart. ) During the Erase or Program operation, the only valid reads from that bank are Data# Polling and Toggle Bit. The other bank may be read. The specified Chip, Block, or Sector Erase time is the only time required to erase. There are no preprogramming or other com- mands or cycles required either internally or externally to erase the chip, block, or sector. Erase Operations The Chip Erase is initiated by a specific six-word load sequence (See Tables 3). A Bank Erase will typically be less than 70 ms. An alternative to the Chip Erase in the Flash bank is the Block or Sector Erase. The Block Erase will erase an entire Block (32K words) in typically 15 ms. The Sector Erase will erase an entire sector (1024 words) in typically 15 ms. The Sector Erase provides a means to alter a single sector using the Sector Erase and Word Program modes. The Sector Erase is initiated by a specific six-word load sequence (see Table 3). During any Sector, Block, or Chip Erase within a bank, any other bank may be read. Chip Erase The LE28DW1621T provides a Chip Erase mode, which allows the user to clear the Flash bank to the "1"state. This is useful when the entire Flash must be quickly erased. The software Flash Chip Erase mode is initiated by issuing the specific six-word loading sequence, as in the Software Data Protection operation. After the loading cycle, the device enters into an internally timed cycle. (See Table 3 for specific codes, Figure 5-1 for a timing waveform, Figure12 for a flowchart. ) Block Erase The LE28DW1621T provides a Block Erase mode, which allows the user to clear any block in the Flash bank to the "1"state. The software Block Erase mode is initiated by issuing the specific six-word loading sequence, as in the Software Data Protect operation. After the loading cycle, the device enters into an internally timed Erase cycle. (See Table 3 for specific codes, Figure 5-2 for the timing waveform, and Figure 13 for a flow- chart.) During the Erase operation, the only valid reads are Data# Polling and Toggle Bit from the selected bank, other banks may perform normal read. Sector Erase The LE28DW1621T provides a Sector Erase mode, which allows the user to clear any sector in the Flash bank to the "1" state. The software Sector Erase mode is initiated by issuing the |
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