97240-01 datasheet(4/21 Pages) PSEMI

Part #	97240-01

Description	Radiation Tolerant UltraCMOS Integer-N Frequency Synthesizer for Low Phase Noise Applications

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Manufacturer	PSEMI [Peregrine Semiconductor]

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Document No. DOC-15214-7 │ UltraCMOS® RFIC Solutions

Product Specification

PE97240

Table 3. Absolute Maximum Ratings

Notes: 1. Human Body Model (MIL-STD-883 Method 3015).

2. Pin 28 is not used in normal operation.

Electrostatic Discharge (ESD) Precautions

When handling this UltraCMOS device, observe

the same precautions that you would use with

other ESD-sensitive devices. Although this device

contains circuitry to protect it from damage due to

ESD, precautions should be taken to avoid

exceeding the rating specified.

Latch-Up Immunity

Unlike conventional CMOS devices, UltraCMOS

devices are immune to latch-up.

Table 2. Operating Ratings

Parameter/Condition

Symbol

Min

Max

Unit

Supply voltage

VDD

–0.3

3.3

V

Voltage on any input

VI

–0.3

VDD + 0.3

V

DC into any input

II

–10

+10

mA

DC into any output

IO

–10

+10

mA

Storage temperature range

TST

–65

+150

°C

ESD voltage HBM1

All pins except pin 28

1000

V

ESD voltage HBM1,2

On pin 28

300

V

VESD_HBM

Thermal resistance

TJC

33.4

°C/W

Junction temperature

TJ

+125

°C

RF input power, CW

50 MHz–5 GHz

PMAX_CW

10

dBm

Parameter/Condition

Symbol

Min

Max

Unit

Supply voltage

VDD

2.6

2.8

V

Operating ambient

temperature range

TA

–40

+85

C

Exceeding absolute maximum ratings may cause

permanent damage. Operation should be

restricted to the limits in the Operating Ranges

table. Operation between operating range

maximum and absolute maximum for extended

periods may reduce reliability.

ELDRS

UltraCMOS devices do not include bipolar minority

carrier elements, and therefore do not exhibit

enhanced low dose rate sensitivity.

Table 4. Single Event Effects1

SEE Mode

Effective Linear Energy Transfer (LET)2

SEL

86 MeV

cm2/mg

SET

30 MeV

cm2/mg 3

SEFI

86 MeV

cm2/mg

SEU

86 MeV

cm2/mg

Notes: 1. Testing performed using serial programming mode.

2. SEE testing was conducted with Au, Ho, Xe, Kr, Cu ion species at 0°

incidence.

3. Minor transients (phase errors) observed resulting in self-recovering

operation without intervention.

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