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100302 Datasheet(PDF) 3 Page - Texas Instruments |
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100302 Datasheet(HTML) 3 Page - Texas Instruments |
3 / 7 page OBSOLETE 100302 www.ti.com SNOS119B – AUGUST 1998 – REVISED APRIL 2013 These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. ABSOLUTE MAXIMUM RATINGS (1) (2) Above which the useful life may be impaired Storage Temperature (TSTG) −65°C to +150°C Maximum Junction Temperature (TJ) Ceramic +175°C VEE Pin Potential to Ground Pin −7.0V to +0.5V Input Voltage (DC) VEE to +0.5V Output Current (DC Output HIGH) −50 mA ESD (3) ≥2000V (1) Absolute Maximum Ratings are those values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. (2) If Military/Aerospace specified devices are required, please contact the TI Sales Office/ Distributors for availability and specifications. (3) ESD testing conforms to MIL-STD-883, Method 3015. RECOMMENDED OPERATING CONDITIONS Case Temperature (TC) Military −55°C to +125°C Supply Voltage (VEE) −5.7V to −4.2V DC ELECTRICAL CHARACTERISTICS - MILITARY VERSION VEE = −4.2V to −5.7V, VCC = VCCA = GND, TC = −55°C to +125°C (1) Symbol Parameter Min Max Units TC Conditions Notes VOH Output HIGH Voltage −1025 −870 mV 0°C to +125°C −1085 −870 mV −55°C VIN = VIH(Max) Loading with See (1)(2)(3) or VIL (Min) 50 Ω to −2.0V VOL Output LOW Voltage −1830 −1620 mV 0°C to +125°C −1830 −1555 mV −55°C VOHC Output HIGH Voltage −1035 mV 0°C to +125°C −1085 mV −55°C VIN = VIH(Max) Loading with See (1)(2)(3) or VIL (Min) 50 Ω to −2.0V VOLC Output LOW Voltage −1610 mV 0°C to +125°C −1555 mV −55°C VIH Input HIGH Voltage −1165 −870 mV −55°C to +125°C Ensured HIGH Signal See (1)(2)(3)(4) for All Inputs VIL Input LOW Voltage −1830 −1475 mV −55°C to +125°C Ensured LOW Signal See (1)(2)(3)(4) for All Inputs IIL Input LOW Current 0.50 μA −55°C to +125°C VEE = −4.2V See (2)(3)(1) VIN = VIH (Max) IIH Input HIGH Current 240 μA 0°C to +125°C VEE = −5.7V See (1)(2)(3) 340 μA −55°C VIN = VIL(Min) IEE Power Supply Current −48 −17 mA −55°C to +125°C Inputs Open See (1)(2)(3)(4) (1) Sample tested (Method 5005, Table I) on each manufactured lot at −55°C, +25°C, and +125°C, Subgroups A1, 2, 3, 7, and 8. (2) F100K 300 Series cold temperature testing is performed by temperature soaking (to ensure junction temperature equals −55°C), then testing immediately without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures. (3) Screen tested 100% on each device at −55°C, +25°C, and +125°C, Subgroups 1, 2, 3, 7, and 8. (4) Ensured by applying specified input condition and testing VOH/VOL. Copyright © 1998–2013, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Links: 100302 |
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