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100302 Datasheet(PDF) 3 Page - Texas Instruments

Part # 100302
Description  Low Power Quint 2-Input OR/NOR Gate
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

100302 Datasheet(HTML) 3 Page - Texas Instruments

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OBSOLETE
100302
www.ti.com
SNOS119B – AUGUST 1998 – REVISED APRIL 2013
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
ABSOLUTE MAXIMUM RATINGS
(1) (2)
Above which the useful life may be impaired
Storage Temperature (TSTG)
−65°C to +150°C
Maximum Junction Temperature (TJ)
Ceramic
+175°C
VEE Pin Potential to Ground Pin
−7.0V to +0.5V
Input Voltage (DC)
VEE to +0.5V
Output Current (DC Output HIGH)
−50 mA
ESD (3)
≥2000V
(1)
Absolute Maximum Ratings are those values beyond which the device may be damaged or have its useful life impaired. Functional
operation under these conditions is not implied.
(2)
If Military/Aerospace specified devices are required, please contact the TI Sales Office/ Distributors for availability and specifications.
(3)
ESD testing conforms to MIL-STD-883, Method 3015.
RECOMMENDED OPERATING CONDITIONS
Case Temperature (TC)
Military
−55°C to +125°C
Supply Voltage (VEE)
−5.7V to −4.2V
DC ELECTRICAL CHARACTERISTICS - MILITARY VERSION
VEE = −4.2V to −5.7V, VCC = VCCA = GND, TC = −55°C to +125°C
(1)
Symbol
Parameter
Min
Max
Units
TC
Conditions
Notes
VOH
Output HIGH Voltage
−1025
−870
mV
0°C to +125°C
−1085
−870
mV
−55°C
VIN = VIH(Max)
Loading with
See (1)(2)(3)
or VIL (Min)
50
Ω to −2.0V
VOL
Output LOW Voltage
−1830
−1620
mV
0°C to +125°C
−1830
−1555
mV
−55°C
VOHC
Output HIGH Voltage
−1035
mV
0°C to +125°C
−1085
mV
−55°C
VIN = VIH(Max)
Loading with
See (1)(2)(3)
or VIL (Min)
50
Ω to −2.0V
VOLC
Output LOW Voltage
−1610
mV
0°C to +125°C
−1555
mV
−55°C
VIH
Input HIGH Voltage
−1165
−870
mV
−55°C to +125°C
Ensured HIGH Signal
See (1)(2)(3)(4)
for All Inputs
VIL
Input LOW Voltage
−1830
−1475
mV
−55°C to +125°C
Ensured LOW Signal
See (1)(2)(3)(4)
for All Inputs
IIL
Input LOW Current
0.50
μA
−55°C to +125°C
VEE = −4.2V
See (2)(3)(1)
VIN = VIH (Max)
IIH
Input HIGH Current
240
μA
0°C to +125°C
VEE = −5.7V
See (1)(2)(3)
340
μA
−55°C
VIN = VIL(Min)
IEE
Power Supply Current
−48
−17
mA
−55°C to +125°C
Inputs Open
See (1)(2)(3)(4)
(1)
Sample tested (Method 5005, Table I) on each manufactured lot at
−55°C, +25°C, and +125°C, Subgroups A1, 2, 3, 7, and 8.
(2)
F100K 300 Series cold temperature testing is performed by temperature soaking (to ensure junction temperature equals
−55°C), then
testing immediately without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold
start” specs which can be considered a worst case condition at cold temperatures.
(3)
Screen tested 100% on each device at
−55°C, +25°C, and +125°C, Subgroups 1, 2, 3, 7, and 8.
(4)
Ensured by applying specified input condition and testing VOH/VOL.
Copyright © 1998–2013, Texas Instruments Incorporated
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