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TPL5111 Datasheet(PDF) 5 Page - Texas Instruments |
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TPL5111 Datasheet(HTML) 5 Page - Texas Instruments |
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5 / 25 page  TPL5111 www.ti.com SNAS659A – JUNE 2015 – REVISED JULY 2015 6.5 Electrical Characteristics (1) Specifications are for TA= 25°C, VDD-GND=2.5 V, unless otherwise stated. PARAMETER TEST CONDITIONS MIN(2) TYP(3) MAX(2) UNIT POWER SUPPLY IDD Supply current(4) Operation mode 35 50 nA Digital conversion of external 200 400 µA resistance (Rext) TIMER tIP Time interval Period 1650 selectable Min time interval 100 ms Time intervals Max time 7200 s interval Time interval Setting Accuracy(5) Excluding the precision of Rext ±0.6% Time interval Setting Accuracy over 1.8V ≤ VDD ≤ 5.5V ±25 ppm/V supply voltage tOSC Oscillator Accuracy -0.5% 0.5% Oscillator Accuracy over -40°C ≤ TA≤ 105°C ±100 ±400 ppm/°C temperature(6) Oscillator Accuracy over supply 1.8V ≤ VDD ≤ 5.5V ±0.4 %/V voltage Oscillator Accuracy over life time(7) ±0.24% tDONE DONE Pulse width (6) 100 ns tDRVn DRVn Pulse width DONE signal not received tIP-50 ms t_Rext Time to convert Rext 100 120 ms DIGITAL LOGIC LEVELS VIH Logic High Threshold DONE pin 0.7xVDD V VIL Logic Low Threshold DONE pin 0.3xVDD V Iout = 100 µA VDD-0.3 V VOH Logic output High Level DRVn pin Iout = 1 mA VDD-0.7 V Iout = -100 µA 0.3 V VOL Logic output Low Level DRVn pin Iout = -1 mA 0.7 V VIHM_DRV Logic High Threshold 1.5 V DELAY/M_DRV pin (1) Electrical Characteristics Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of the device such that TJ = TA. No specification of parametric performance is indicated in the electrical tables under conditions of internal self-heating where TJ > TA. Absolute Maximum Ratings indicate junction temperature limits beyond which the device may be permanently degraded, either mechanically or electrically. (2) Limits are specified by testing, design, or statistical analysis at 25°C. Limits over the operating temperature range are specified through correlations using statistical quality control (SQC) method. (3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and will also depend on the application and configuration. The typical values are not tested and are not specified on shipped production material. (4) The supply current excludes load and pull-up resistor current. Input pins are at GND or VDD. (5) The accuracy for time interval settings below 1second is ±100ms. (6) This parameter is specified by design and/or characterization and is not tested in production. (7) Operational life time test procedure equivalent to10 years. Copyright © 2015, Texas Instruments Incorporated Submit Documentation Feedback 5 Product Folder Links: TPL5111 |
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