TLV2556

SLAS355B – DECEMBER 2001 – REVISED DECEMBER 2015

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over recommended operating free-air temperature range,

MIN

MAX

UNIT

Pulse duration I/O CLOCK high or low

26.7

100000

ns

Set-up time DATA IN valid before I/O CLOCK rising edge (see Figure 47)

12

ns

Hold time DATA IN valid after I/O CLOCK rising edge (see Figure 47)

0

ns

25

ns

Hold time CS pulse duration high time (see Figure 48)

100

ns

Hold time CS low after last I/O CLOCK falling edge (see Figure 48)

0

ns

Hold time DATA OUT valid after I/O CLOCK falling edge (see Figure 49)

2

ns

Hold time CS high after EOC rising edge when CS is toggled (see Figure 52)

0

ns

Hold time CS high after INT falling edge (seeFigure 52)

0

ns

Hold time I/O CLOCK low after EOC rising edge or INT falling edge when CS is held low

10

ns

(seeFigure 53)

Load = 25 pF

28

Delay time CS falling edge to DATA OUT valid (MSB or

ns

LSB) (see Figure 46)

Load = 10 pF

20

Delay time CS rising edge to DATA OUT high impedance (see Figure 46)

10

ns

Delay time I/O CLOCK falling edge to next DATA OUT bit valid (see Figure 49)

2

20

ns

Delay time last I/O CLOCK falling edge to EOC falling edge (seeFigure 50)

55

ns

Delay time last I/O CLOCK falling edge to CS falling edge to abort conversion

1.5

μs

Delay time last I/O CLOCK falling edge to INT falling edge (see Figure 50)

ns

Delay time EOC rising edge or INT falling edge to DATA OUT valid: MSB or LSB 1st

4

ns

(see Figure 51)

Delay time I/O CLOCK high to INT rising edge when CS is held low (see Figure 53)

1

28

ns

1

μs

Transition time DATA OUT (see Figure 49)

5

ns

2.4

ns

Transition time DATA IN, CS

10

μs

μs

Source impedance = 25

Ω

600

Source impedance = 100

Ω

650

Channel acquisition time (sample) at 1 k

ns

(see Figure 1 through Figure 6)

Source impedance = 500

Ω

700

Source impedance = 1 k

Ω

1000

(1)

I/O CLOCK period = 8 × [1/(I/O CLOCK frequency)] or 12 × [1/(I/O CLOCK frequency)] or 16 × [1/(I/O CLOCK frequency)], depending

on I/O format selected

(2)

(1)

8

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