Si871x/2x

8

Rev. 1.0

Table 3. Regulatory Information*

CSA

The Si871x/2x is certified under CSA Component Acceptance Notice 5A. For more details, see File 232873.

voltage.

VDE

The Si871x/2x is certified according to IEC60747 and VDE0884. For more details, see File 5006301-4880-0001.

UL

The Si871x/2x is certified under UL1577 component recognition program. For more details, see File E257455.

CQC

The Si871x/2x is certified under GB4943.1-2011. For more details, see File V2012CQC001041.

For more information, see "8.Ordering Guide" on page 22.

Table 4. Insulation and Safety-Related Specifications

Parameter

Symbol

Test Condition

Value

Unit

SOIC-8

DIP8

SDIP6

Nominal Air Gap (Clearance)

L(IO1)

4.7 min

7.2 min

9.6 min

mm

Nominal External Tracking

(Creepage)

L(IO2)

3.9 min

7.0 min

8.3 min

mm

Minimum Internal Gap

(Internal Clearance)

0.016

0.016

0.016

mm

Tracking Resistance

(Proof Tracking Index)

PTI

IEC60112

600

600

600

V

Erosion Depth

ED

0.031

0.031

0.057

mm

Resistance (Input-Output)*



Capacitance (Input-Output)*

f=1 MHz

1

1

1

pF

*Note: To determine resistance and capacitance, the Si871x/2x is converted into a 2-terminal device. Pins 1–4 (1–3, SDIP6)

are shorted together to form the first terminal, and pins 5–8 (4–6, SDIP6) are shorted together to form the second

terminal. The parameters are then measured between these two terminals.