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LM185H-1.2/883 Datasheet(PDF) 3 Page - Texas Instruments |
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LM185H-1.2/883 Datasheet(HTML) 3 Page - Texas Instruments |
3 / 18 page LM185-1.2QML www.ti.com SNVS384B – OCTOBER 2005 – REVISED JANUARY 2014 Absolute Maximum Ratings (1) Reverse Current 30mA Forward Current 10mA Operating Temperature Range −55°C ≤ TA ≤ +125°C Maximum Junction Temperature (TJmax) (2) +150°C Storage Temperature −55°C ≤ TA ≤ +150°C Lead Temperature (Soldering 10 CLGA 260°C Seconds) TO package 300°C 20LD LCCC package 300°C Thermal Resistance θJA TO (Still Air) 300°C/W TO (500LF / Min Air Flow) 139°C/W 20LD LCCC (Still Air) 100°C/W 20LD LCCC (500LF / Min Air 73°C/W Flow) CLGA (Still Air) 194°C/W CLGA (500LF / Min Air Flow) 128°C/W θJC TO 57°C/W 20LD LCCC 25°C/W CLGA 23°C/W Package Weight (Typical) TO TBD 20LD LCCC TBD CLGA 210mg ESD Tolerance(3) 4KV (1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is functional. For specifications and test conditions, see the Electrical Characteristics. The specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions. (2) The maximum power dissipation must be derated at elevated temperatures and is dictated by TJmax (maximum junction temperature), θJA (package junction to ambient thermal resistance), and TA (ambient temperature). The maximum allowable power dissipation at any temperature is PDmax = (TJmax - TA)/θJA or the number given in the Absolute Maximum Ratings, whichever is lower. (3) Human body model, 1.5K Ω in series with 100pF. Quality Conformance Inspection Table 1. Mil-Std-883, Method 5005 - Group A Subgroup Description Temp °C 1 Static tests at 25 2 Static tests at 125 3 Static tests at -55 4 Dynamic tests at 25 5 Dynamic tests at 125 6 Dynamic tests at -55 7 Functional tests at 25 8A Functional tests at 125 8B Functional tests at -55 9 Switching tests at 25 10 Switching tests at 125 11 Switching tests at -55 12 Settling time at 25 13 Settling time at 125 14 Settling time at -55 Copyright © 2005–2014, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Links: LM185-1.2QML |
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