DMNH3010LK3

Document number: DS38455 Rev. 2 - 2

2 of 7

www.diodes.com

January 2016

© Diodes Incorporated

DMNH3010LK3

Characteristic

Symbol

Value

Unit

Drain-Source Voltage

30

V

Gate-Source Voltage

±20

V

Steady

State

55

40

A

Steady

State

15

10.6

A

Pulsed Drain Current (10µs Pulse, Duty Cycle = 1%)

100

A

Avalanche Current (Note 7) L = 0.8mH

15

A

Avalanche Energy (Note 7) L = 0.8mH

75

mJ

Thermal Characteristics

Characteristic

Symbol

Value

Unit

Total Power Dissipation (Note 5)

2.0

W

Thermal Resistance, Junction to Ambient (Note 5)

Steady State

74

°C/W

t<10s

31

°C/W

Total Power Dissipation (Note 6)

3.2

W

Thermal Resistance, Junction to Ambient (Note 6)

Steady State

47

°C/W

t<10s

21

°C/W

Thermal Resistance, Junction to Case (Note 6)

2.5

°C/W

Operating and Storage Temperature Range

-55 to +175

°C

Characteristic

Symbol

Min

Typ

Max

Unit

Test Condition

OFF CHARACTERISTICS (Note 8)

Drain-Source Breakdown Voltage

30

—

—

V

Zero Gate Voltage Drain Current

—

—

1

μA

Gate-Source Leakage

—

—

±100

nA

ON CHARACTERISTICS (Note 8)

Gate Threshold Voltage

1.0

—

2.5

V

Static Drain-Source On-Resistance

—

8

9.5

m

Ω

—

10

11.5

Diode Forward Voltage

—

0.75

1.0

V

DYNAMIC CHARACTERISTICS (Note 9)

Input Capacitance

—

2075

—

pF

f = 1.0MHz

Output Capacitance

—

190

—

Reverse Transfer Capacitance

—

138

—

Gate Resistance

—

2.4

—

Ω

—

16.1

—

nC

—

37

—

Gate-Source Charge

—

6.1

—

Gate-Drain Charge

—

5.9

—

Turn-On Delay Time

—

4.5

—

ns

Turn-On Rise Time

—

19.6

—

Turn-Off Delay Time

—

31

—

Turn-Off Fall Time

—

10.7

—

Reverse Recovery Time

—

13.7

—

ns

Reverse Recovery Charge

—

18.3

—

nC

Notes:

5. Device mounted on FR-4 substrate PC board, 2oz copper, with minimum recommended pad layout.

6. Device mounted on FR-4 substrate PC board, 2oz copper, with 1inch square copper plate.

8. Short duration pulse test used to minimize self-heating effect.

9. Guaranteed by design. Not subject to product testing.