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NCP4206 Datasheet(PDF) 6 Page - ON Semiconductor |
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NCP4206 Datasheet(HTML) 6 Page - ON Semiconductor |
6 / 32 page NCP4206 http://onsemi.com 6 ELECTRICAL CHARACTERISTICS VIN = (5.0 V) FBRTN − GND, for typical values TA = 25°C, for min/max values TA = 0°C to 85°C; unless otherwise noted. (Notes 6 and 8) Parameter Unit Max Typ Min Symbol Test Conditions ERROR AMPLIFIER Offset Accuracy VR Offset Register = 111111, VID = 1.0 V VR Offset Register = 011111, VID = 1.0 V −193.75 193.75 mV FBRTN Current IFBRTN 70 200 mA Output Current FB forced to VOUT −3% ICOMP 500 mA Gain Bandwidth Product COMP = FB GBW(ERR) 20 MHz Slew Rate COMP = FB 25 V/ms BOOT Voltage Hold Time Internal Timer tBOOT 2.0 ms VID INPUTS Input Low Voltage Input High Voltage VID(X) VIL(VID) VIH(VID) 0.8 0.3 V Input Current IIN(VID) −5.0 mA VID Transition Delay Time VID code change to FB change 400 ns No CPU Detection Turn−Off Delay Time VID code change to PWM going low 5.0 ms OSCILLATOR Frequency Range fOSC 0.25 9.0 MHz Frequency Variation TA = 25°C, RT = 500 kW, 4−phase TA = 25°C, RT = 250 kW, 4−phase TA = 25°C, RT = 121 kW, 4−phase fPHASE 170 195 375 750 225 kHz Output Voltage RT = 500 kW to GND VRT 1.9 2.0 2.1 V RAMPADJ Output Voltage RAMPADJ − FB, VFB = 1.0 V, IRAMPADJ = −150 mA VRAMPADJ −50 +50 mV RAMPADJ Input Current Range IRAMPADJ 5.0 125 mA CURRENT SENSE AMPLIFIER Offset Voltage CSSUM − CSREF (Note 9) VOS(CSA) −1.0 +1.0 mV Input Bias Current, CSREF CSREF = 1.0 V IBIAS(CSREF) −20 +20 mA Input Bias Current, CSSUM CSREF = 1.0 V IBIAS(CSSUM) −10 +10 nA Gain Bandwidth Product CSSUM = CSCOMP GBW(CSA) 10 MHz Slew Rate CCSCOMP = 10 pF 10 V/ms Input Common−Mode Range CSSUM and CSREF 0 3.0 V Output Voltage Range 0.05 3.0 V Output Current ICSCOMP 500 mA Current Limit Latchoff Delay Time Internal Timer 8.0 ms PSI Input Low Voltage Input High Voltage 0.8 0.3 V Input Current −5.0 mA Assertion Timing Fsw = 300kHz 3.3 ms De−assertion Timing Fsw = 300kHz 825 ns 6. Refer to Absolute Maximum Ratings and Application Information for Safe Operating Area. 7. Performance guaranteed over the indicated operating temperature range by design and/or characterization tested at TJ = TA = 25_C. Low duty cycle pulse techniques are used during testing to maintain the junction temperature as close to ambient as possible. 8. Refer to Application Information Note. 9. Values based on design and/or characterization. |
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