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DAC8803IDBRG4 Datasheet(PDF) 2 Page - Texas Instruments

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Part # DAC8803IDBRG4
Description  Quad, Serial Input 14-Bit Multiplying Digital-to-Analog Converter
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

DAC8803IDBRG4 Datasheet(HTML) 2 Page - Texas Instruments

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ABSOLUTE MAXIMUM RATINGS
(1)
DAC8803
SBAS340C – JANUARY 2005 – REVISED FEBRUARY 2006
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PACKAGE/ORDERING INFORMATION(1)
MINIMUM
RELATIVE
DIFFERENTIAL
SPECIFIED
TRANSPORT
ACCURACY
NONLINEARITY
TEMPERATURE
PACKAGE-
PACKAGE
ORDERING
MEDIA
PRODUCT
(LSB)
(LSB)
RANGE
LEAD
DESIGNATOR
NUMBER
QUANTITY
DAC8803IDBT
Tape and Reel, 250
DAC8803
±1
±1
-40°C to +85°C
SSOP-28
DB
DAC8803IDBR
Tape and Reel, 2500
(1)
For the most current specifications and package information, see the Package Option Addendum at the end of this document, or see the
TI website at www.ti.com
DAC8803
UNIT
VDD to GND
-0.3 to +8
V
VREF to GND
-18 to +18
V
Logic inputs and output to GND
-0.3 to +8
V
V(IOUT) to GND
-0.3 to VDD + 0.3
V
AGNDX to DGND
-0.3 to +0.3
V
Input current to any pin except supplies
±50
mA
Package power dissipation
(TJmax - TA)/θJA
W
Thermal resistance,
θ
JA
28-Lead shrink surface-mount (RS-28)
100
°C/W
Maximum junction temperature (TJmax)
150
°C
Operating temperature range, Model A
-40 to +85
°C
Storage temperature range
-65 to +150
°C
(1)
Stresses above those listed under absolute maximum ratings may cause permanent damage to the device. This is a stress rating only;
functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification
is not implied. Exposure to absolute maximum conditions for extended periods may affect device reliability.
2
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