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EFC4626R Datasheet(PDF) 3 Page - ON Semiconductor |
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EFC4626R Datasheet(HTML) 3 Page - ON Semiconductor |
3 / 6 page EFC4626R No.A2292-3/6 Test circuits are example of measuring FET1 side When FET2 is measured, the position of FET1 and FET2 is switched. G2 G1 S1 S2 A G2 G1 S1 S2 A G2 G1 S1 S2 A G2 G1 S1 S2 A G2 G1 S1 S2 V IS Test Circuit 1 ISSS Test Circuit 2 IGSS Test Circuit 3 VGS(th) Test Circuit 4 gFS Test Circuit 5 RSS(on) VGS VGS VGS VGS When FET1 is measured, Gate and Source of FET2 are short-circuited. When FET1 is measured, Gate and Source of FET2 are short-circuited. When FET1 is measured, Gate and Source of FET2 are short-circuited. VSS VSS VSS G2 G1 S1 S2 PG RL A Test Circuit 7 Qg IG =1mA VSS When FET1 is measured, Gate and Source of FET2 are short-circuited. G2 G1 S1 S2 V PG RL Test Circuit 6 td(on), tr,td(off), tf VSS When FET1 is measured, Gate and Source of FET2 are short-circuited. G2 G1 S1 S2 V IS VGS=0V Test Circuit 8 VF(S-S) When FET1 is measured,+4.5V is added to VGS of FET2. |
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