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IC61C256AH Datasheet(PDF) 5 Page - Integrated Circuit Solution Inc

Part No. IC61C256AH
Description  32K x 8 HIGH-SPEED CMOS STATIC RAM
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Maker  ICSI [Integrated Circuit Solution Inc]
Homepage  http://www.icsi.com.tw
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IC61C256AH
Integrated Circuit Solution Inc.
5
AHSR010-0D 4/19/2002
AC TEST LOADS
Figure 1.
Figure 2.
AC TEST CONDITIONS
Parameter
Unit
Input Pulse Level
0V to 3.0V
Input Rise and Fall Times
3 ns
Input and Output Timing
1.5V
and Reference Levels
Output Load
See Figures 1 and 2
480
30 pF
Including
jig and
scope
255
OUTPUT
5V
480
5 pF
Including
jig and
scope
255
OUTPUT
5V
READ CYCLE SWITCHING CHARACTERISTICS(1) (Over Operating Range)
-10
-12
-15
-20
-25
Symbol Parameter
Min.
Max.
Min.
Max.
Min.
Max.
Min.
Max.
Min.
Max.
Unit
tRC
Read Cycle Time
10
12
15
20
25
ns
tAA Address Access Time
10
12
15
20
25
ns
tOHA
Output Hold Time
2
2
2
2
2
ns
tACE
CE Access Time
10
12
15
20
25
ns
tDOE
OE Access Time
5
5
7
8
9
ns
tLZOE(2)OE to Low-Z Output
0
0
0
0
0
ns
tHZOE(2)OE to High-Z Output
5
6
7
9
10
ns
tLZCE(2)CE to Low-Z Output
2
3
3
3
3
ns
tHZCE(2)CE to High-Z Output
5
7
8
9
10
ns
tPU(3)
CE to Power-Up
0
0
0
0
0
ns
tPD(3) CE to Power-Down
10
12
15
18
20
ns
Notes:
1. Test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V
and output loading specified in Figure 1.
2. Tested with the load in Figure 2. Transition is measured ±200 mV from steady-state voltage. Not 100% tested.
3. Not 100% tested.




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