Electronic Components Datasheet Search |
|
KAI-16000-AXA-JR-AE Datasheet(PDF) 11 Page - ON Semiconductor |
|
KAI-16000-AXA-JR-AE Datasheet(HTML) 11 Page - ON Semiconductor |
11 / 27 page KAI−16000 www.onsemi.com 11 TEST DEFINITIONS Test Regions of Interest Image Area ROI: Pixel (1, 1) to Pixel (4872, 3248) Only the active pixels are used for performance and defect tests. Overclocking The test system timing is configured such that the sensor is overclocked in both the vertical and horizontal directions. See Figure 8 for a pictorial representation of the regions. Figure 8. Overclock Regions of Interest Pixel 1,1 VerticalOverclock H V |
Similar Part No. - KAI-16000-AXA-JR-AE |
|
Similar Description - KAI-16000-AXA-JR-AE |
|
|
Link URL |
Privacy Policy |
ALLDATASHEET.COM |
Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Datasheet Upload | Contact us | Privacy Policy | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |