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NCP81174MNTXG Datasheet(PDF) 9 Page - ON Semiconductor |
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NCP81174MNTXG Datasheet(HTML) 9 Page - ON Semiconductor |
9 / 18 page NCP81174 www.onsemi.com 9 ELECTRICAL CHARACTERISTICS (VVCC = 5 V, VREFIN = 1.0 V, VPSI = 3.3 V, typical values are referenced to TA = 25°C, Min and Max values are referenced to TA from 0°C to 100 °C. unless other noted.) Characteristics Unit Max Typ Min Symbol Test Conditions DRVON Fall Time CL (PCB) = 20pF, DVo = 10% to 90% − 20 − ns ENABLE Enable Threshold EN rising − 1.1 1.15 V EN falling 0.95 1.0 EN 3.3V IO Detection Threshold EN rising 2.5 2.55 V EN falling 2.35 2.4 EN Input Bias Current External 1k pull−up to 3.3 V − − 1.0 mA POWER SAVE INPUT PSI High Threshold (3.3 V input logic), Refer to Table 1 Rising Falling VhighPSI_3.3V 2.05 2.4 2.2 2.55 V PSI High Threshold (1.8 V input logic), Refer to Table 2 Rising Falling VhighPSI_1.8V 1.05 1.4 1.2 1.55 V PSI Low Threshold Rising Falling VlowPSI 0.5 0.8 0.6 0.95 V PSI Input Bias Current (Note 3) − − 1.0 mA PWM OUTPUTS Output High Voltage Sourcing 500 mA 3.0 − − V Mid Output Voltage 1.4 1.5 1.6 V Output Low Voltage Sinking 500 mA − − 0.7 V Rise Time CL (PCB) = 50 pF, DVo = 10% to 90% − 10 15 ns Fall Time CL (PCB) = 50 pF, DVo = 10% to 90% − 10 15 ns 4/3/2 PHASE DETECTION Gate Pin Source Current − 80 − uA Gate Pin Threshold Voltage 210 240 265 mV Phase Detect Timer − 20 27 ms VR_RDY – STARTUP Vout Startup Delay Measured from EN to Vout Start up from 0 V 1.3 ms VR_RDY Startup Delay Measured from EN to VR_RDY assertion 1.9 ms VR_RDY Shutdown Delay Measured from EN to VR_RDY de−assertion 200 350 ns VR_RDY Low Voltage IVR_RDY= 10 mA (sink) − − 0.4 V VR_RDY Leakage Current VR_RDY = 5 V − − 0.2 mA PROTECTION – OCP, OVP, UVP Current Limit ILIM to VDRP Gain 0.95 1.0 1.05 V/V Current Limit ILIM to VDRP Gain in PSI 0.25 V/V Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions. 3. Guaranteed by design, may not be tested. |
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