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LV8411GR Datasheet(PDF) 1 Page - ON Semiconductor |
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LV8411GR Datasheet(HTML) 1 Page - ON Semiconductor |
1 / 7 page 62012 SY 20120604-S00001/70908 MS PC 20080703-S00001 No.A1250-1/7 http://onsemi.com Semiconductor Components Industries, LLC, 2013 June, 2013 LV8411GR Overview The LV8411GR is an H bridge motor driver IC and is able to control 4 modes of forward, reverse, brake, and standby. This IC housed in a miniature package is optimum for use in a stepping motor driving system for DSC or a camera module of cell phones. Features • Saturation drive H bridge: 4 channels • Built-in thermal protection circuit • Built-in low voltage malfunction prevention circuit • Incorporates a transistor for driving photosensors Specifications Absolute Maximum Ratings at Ta = 25 °C Parameter Symbol Conditions Ratings Unit Power supply voltage 1 VM max 6.0 V Power supply voltage 2 VCC max 6.0 V Output peak current IO peak Channels 1 to 4, t ≤ 10msec, ON-duty ≤ 20% 600 mA Output continuous current 1 IO max1 Channels 1 to 4 400 mA Output continuous current 2 IO max2 PI1 30 mA Allowable power dissipation Pd max Mounted on a circuit board* 1.05 W Operating temperature Topr -40 to +85 °C Storage temperature Tstg -55 to +150 °C * Specified circuit board : 40mm ×50mm×0.8mm : glass epoxy four-layer board Caution 1) Absolute maximum ratings represent the value which cannot be exceeded for any length of time. Caution 2) Even when the device is used within the range of absolute maximum ratings, as a result of continuous usage under high temperature, high current, high voltage, or drastic temperature change, the reliability of the IC may be degraded. Please contact us for the further details. Bi-CMOS LSI For DSC, and Cell Phone Camera Modules 4-channel Single-chip Motor Driver IC Ordering number : ENA1250A Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. |
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