KAF−8300

www.onsemi.com

10

Description

Verification

Plan

Notes

Unit

Max.

Nom.

Min.

Symbol

MONOCHROME DEVICES

Sensitivity − Monochrome

Resp

465

−

655

mV

Die18

Quantum Efficiency

Microlens, Clear Glass (540 nm)

Microlens, No Glass (540 nm)

Microlens, AR Glass (540 nm)

No Microlens, Clear G. (560 nm)

QE

−

−

−

−

54

60

56

37

−

−

−

−

%

Design19

1. Increasing output load currents to improve bandwidth will decrease these values.

2. Specified from 12

°C to 60°C.

3. Saturation signal level achieved while meeting Le specification. Specified from 0

°C to 40°C.

4. Operating temperature = 60

°C.

6. Operating temperature = 25

°C.

7. Peak to peak non-uniformity test based on an average of 185

× 185 blocks.

8. Average non-illuminated signal with respect to over clocked horizontal register signal.

9. Absolute difference between the maximum and minimum average signal levels of 185

× 185 blocks within the sensor.

10. Dark rms deviation of a multi-sampled pixel as measured using the KAF−8300 Evaluation Board.

12. Gradual variations in hue (red with respect to green pixels and blue with respect to green pixels) in regions of interest of 185

× 185 blocks.

failure. X_b characterized at 25

°C.

15. Video level DC offset with respect to ground at clamp position. Refer to Figure 17.

17. Amount of artificial signal due to H1 coupling.

18. A parameter that is measured on every sensor during production testing.

19. A parameter that is quantified during the design verification activity.

20. Calculated value subtracting the noise contribution from the KAF−8300 Evaluation Board.

21. Process optimization has effectively eliminated vertical striations.

22. CTE = 1 − CTI. Where CTE is charge transfer efficiency and CTI is charge transfer inefficiency. CTI is the measured value.