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BQ25120 Datasheet(PDF) 10 Page - Texas Instruments

Part # BQ25120
Description  bq25120 700-nA Low IQ Highly Integrated Battery Charge Management Solution for Wearables and IoT
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

BQ25120 Datasheet(HTML) 10 Page - Texas Instruments

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BQ25120
SLUSBZ9A – AUGUST 2015 – REVISED AUGUST 2015
www.ti.com
Electrical Characteristics (continued)
Circuit of , V(UVLO) < VIN < V(OCP) and VIN > V(BAT) + V(SLP), TJ = -40 to 85°C and TJ = 25°C for typical values (unless otherwise
noted)
PARAMETERS
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Quiescent current for VINLS
0.9
µA
in LDO mode
IIN(LDO)
OFF-state supply current
0.25
µA
High-level input voltage for
VIH(LSCTRL)
1.15 V > V(VINLS) > 6.6 V
0.75 x V(SYS)
6.6
V
LSCTRL
Low-level input voltage for
VIL(LSCTRL)
1.15 V > V(VINLS) > 6.6 V
0.25 x V(SYS)
V
LSCTRL
PUSHBUTTON TIMER (MR)
VIL
Low-level input voltage
0.3
V
RPU
Internal pull-up resistance
120
k
Ω
VBAT MONITOR
Battery Voltage Monitor
VBMON
V(BAT) Falling - Including 2% increment
-3.5
3.5
%V(BATREG)
Accuracy
BATTERY-PACK NTC MONITOR
VHOT
High temperature threshold
VTS falling, 1% VIN Hysteresis
14.5
15
15.2
%VIN
VWARM
Warm temperature threshold
VTS falling, 1% VIN Hysteresis
20.1
20.5
20.8
%VIN
VCOOL
Cool temperature threshold
VTS rising, 1% VIN Hysteresis
35.4
36
36.4
%VIN
VCOLD
Low temperature threshold
VTS rising, 1% VIN Hysteresis
39.3
39.8
40.2
%VIN
TSOFF
TS Disable threshold
VTS rising, 2% VIN Hysteresis
55
60
%VIN
PROTECTION
V(UVLO)
IC active threshold voltage
VIN rising
3.4
3.6
3.8
V
VUVLO(HYS)
IC active hysteresis
VIN falling from above VUVLO
150
mV
Battery Undervoltage Lockout
Programmable Range for V(BUVLO) VBAT
2.2
3.0
V
threshold Range
falling, 200 mV Hysteresis
V(BUVLO)
Default Battery Undervoltage
V(BAT) falling
-2.5%
2.5%
Lockout Accuracy
V(BATSHORT)
Battery short circuit threshold
Battery voltage falling
2
V
V(BATSHORT_HY
Hysteresis for V(BATSHORT)
100
mV
S)
Battery short circuit charge
I(BATSHORT)
I(PRETERM)
mA
current
Sleep entry threshold, VIN -
V(SLP)
2 V < VBAT < V(BATREG), VIN falling
65
120
mV
V(BAT)
V(SLP_HYS)
Sleep-mode exit hysteresis
VIN rising above V(SLP)
40
65
100
mV
Maximum Input Supply OVP
VOVP
VIN rising, 100 mV hysteresis
5.35
5.55
5.75
V
threshold voltage
tDGL_OVP
Deglitch time, VIN OVP falling
VIN falling below VOVP, 1V/us
32
ms
TSHTDWN
Thermal trip
VIN > VUVLO
114
°C
THYS
Thermal hysteresis
VIN > VUVLO
11
°C
Deglitch time, Thermal
tDGL_SHTDWN
TJ rising above TSHTDWN
4
µs
shutdown
I2C INTERFACE
I2C Bus Specification
100
400
kHz
standard and fast mode
frequency support
VIL
Input low threshold level
VPULLUP = 1.1 V, SDA and SCL
0.275
V
VIH
Input high threshold level
VPULLUP = 1.1 V, SDA and SCL
0.825
V
VIH
Input high threshold level
VPULLUP = 3.3 V, SDA and SCL
2.475
V
VOL
Output low threshold level
IL = 5mA, sink current, VPULLUP = 1.1 V
0.275
V
IBIAS
High-Level leakage current
VPULLUP = 1.8V, SDA and SCL
1
µA
INT, PG, and RESET OUTPUT (Open Drain)
VOL
Low level output threshold
Sinking current = 5 mA
0.25 x V(SYS)
V
IIN
Bias current into pin
Pin is high impedance, IOUT = 0 mA
0
12
nA
10
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