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KAI-1020-FBA-FD-BA Datasheet(PDF) 10 Page - ON Semiconductor |
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KAI-1020-FBA-FD-BA Datasheet(HTML) 10 Page - ON Semiconductor |
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10 / 63 page  KAI−1020 www.onsemi.com 10 Table 6. SPECIFICATIONS (continued) Description Sampling Plan* Notes Unit Max. Nom. Min. Symbol POWER Single Channel CDS − 213 − mW 12 VCCD clock driver − 71 − mW 16 Electronic shutter driver − 1.1 − mW HCCD − 122 − mW 16, 17 Total Power − 407 − mW 12, 16 *Sampling plan defined as “Die” indicates that every device is verified against the specified performance limits. Sampling plan defined as “Design” indicates a sampled test or characterization, at the discretion of ON Semiconductor, against the specified performance limits. 1. Measured with F/4 imaging optics. 2. Value is the angular range of incident light for which the quantum efficiency is at least 50% of QEMAX at a wavelength of lQE. Angles are measured with respect to the sensor surface normal in a plane parallel to the horizontal axis ( QQEH) or in a plane parallel to the vertical axis ( QQEV). 3. Value is over the range of 10% to 90% of photodiode saturation. 4. Value is for the sensor operated without binning. 5. This value depends on the substrate voltage setting. Higher photodiode saturation charge capacities will lower the anti-blooming specification. Substrate voltage will be specified with each part for 42 ke−. 6. Measured at 40 °C, 40 MHz HCCD frequency. 7. This is the first field decay lag at 70% saturation. Measured by strobe illumination of the device at 70% of photodiode saturation, and then measuring the subsequent frame’s average pixel output in the dark. 8. Measured with a spot size of 100 vertical pixels, no electronic shutter. 9. Measured with green light (500 nm to 580 nm). 10. A blooming condition is defined as when the spot size doubles in size. 11. Anti-blooming factor is the light intensity which causes blooming divided by the light intensity which first saturates the photodiodes. 12. Single output power, 3 mA load. 13. With total output load capacitance of CL= 10 pF between the outputs and AC ground. 14. Includes system electronics noise, dark pattern noise and dark current shot noise at 40 MHz. Total noise measured on the KAI−1020 evaluation board. 15. Uses 20LOG (Pne /ne−T) 16. At 30 frames/sec, single output. 17. This includes the power of the external HCCD clock driver. 18. For the sampling plan, measured at 10 MHz 19. Tested at 27 °C and 40°C 20. See Tests |
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