28C17A

DS11127G-page 4

© 1996 Microchip Technology Inc.

TABLE 1-4:

BYTE WRITE AC CHARACTERISTICS

FIGURE 1-2:

PROGRAMMING WAVEFORMS

AC Testing Waveform:

Output Load:

1 TTL Load + 100 pF

Input Rise/Fall Times:

20 ns

Ambient Temperature:

Commercial (C):

Tamb

=

0˚C to +70˚C

Industrial

(I):

Tamb

=

-40˚C to +85˚C

Parameter

Symbol

Min

Max

Units

Remarks

Address Set-Up Time

10

—

ns

Address Hold Time

50

—

ns

Data Set-Up Time

50

—

ns

Data Hold Time

10

—

ns

Write Pulse Width

100

—

ns

Note 1

Write Pulse High Time

50

—

ns

OE Hold Time

10

—

ns

OE Set-Up Time

10

—

ns

Data Valid Time

—

1000

ns

Note 2

Time to Device Busy

250

ns

—

1

ms

0.5 ms typical

—

200

µs

100

µs typical

Note 1: A write cycle can be initiated be CE or WE going low, whichever occurs last. The data is latched on the pos-

itive edge of CE or WE, whichever occurs first

the positive edge of WE or CE, whichever occurs first.

Address

CE, WE

Data In

OE

Rdy/Busy

Busy

Ready