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DG407DJZ Datasheet(PDF) 8 Page - Intersil Corporation |
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DG407DJZ Datasheet(HTML) 8 Page - Intersil Corporation |
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8 / 15 page  8 FN3116.11 October 1, 2013 DG406, DG407 FIGURE 4A. DG406 TEST CIRCUIT FIGURE 4B. DG407 TEST CIRCUIT FIGURE 4C. MEASUREMENT POINTS FIGURE 4. ENABLE SWITCHING TIMES FIGURE 5A. TEST CIRCUIT FIGURE 5B. MEASUREMENT POINTS FIGURE 5. BREAK-BEFORE-MAKE INTERVAL Test Circuits and Waveforms (Continued) EN A3 DG406 GND A2 A1 S1 S2 - S16 D V- V+ -5V VO 35pF 300 Ω 50 Ω +15V -15V A0 LOGIC INPUT VIN EN A0 DG407 GND A1 A2 S1B † DA AND DB V- V+ -5V VO 35pF 300 Ω 50 Ω +15V -15V † = S1A - S8A, S2B - S8B, DA LOGIC INPUT VIN LOGIC INPUT SWITCH OUTPUT VO 3V VO 50% tr < 20ns tf < 20ns tON(EN) 0V 50% tOFF(EN) 90% 0V VIN VO EN A3 DG406 GND A2 A1 ALL S D, V- V+ +5V (VS) VO 35pF 300 Ω 50 Ω +15V +2.4V -15V A0 DG407 AND DA DB LOGIC INPUT LOGIC INPUT SWITCH OUTPUT VO 3V VS tr < 20ns tf < 20ns tOPEN 0V 0V 80% |
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