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MIC284-3BM Datasheet(PDF) 5 Page - Micrel Semiconductor |
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MIC284-3BM Datasheet(HTML) 5 Page - Micrel Semiconductor |
5 / 20 page September 29, 2000 5 MIC284 MIC284 Micrel Note 1. Exceeding the absolute maximum rating may damage the device. Note 2. The device is not guaranteed to function outside its operating rating. Note 3. Devices are ESD sensitive. Handling precautions recommended. Human body model: 1.5k in series with 100pF. Machine model: 200pF, no series resistance. Note 4. Final test on outgoing product is performed at T A = TBD°C. Note 5. T D is the temperature of the remote diode junction. Testing is performed using a single unit of one of the transistors listed in Table 6. Note 6. Current into this pin will result in self-heating of the MIC284. Sink current should be minimized for best accuracy. Note 7. Guaranteed by design over the operating temperature range. Not 100% production tested. Note 8. t CONV = tCONV0 + tCONV1. tCONV0 is the conversion time for the local zone; tCONV1 is the conversion time for the remote zone.` Note 9. Accuracy specification does not include quantization noise, which may be as great as ±1⁄2LSB (±0.5°C). Timing Diagram t1 t2 t5 t4 t3 SCL SDA Data In SDA Data Out Serial Interface Timing |
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