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TSE2004GB2B0 Datasheet(PDF) 4 Page - Integrated Device Technology |
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TSE2004GB2B0 Datasheet(HTML) 4 Page - Integrated Device Technology |
4 / 31 page 4 of 31 September 16, 2014 *Notice: The information in this document is subject to change without notice AC Measurement Conditions AC Measurement I/O Waveform Input Parameters for the TSE2004GB2B0 1.TA=25°C, f=400 kHz 2.Verified by design and characterization not necessarily tested on all devices Symbol Parameter Min. Max. Units CL Load capacitance 100 pF Input rise and fall times 50 ns Input levels 0.2*VDDSPD to 0.8*VDDSPD V Input and output timing reference levels 0.3*VDDSPD to 0.7*VDDSPD V Symbol Parameter1,2 Test Condition Min. Max. Units CIN Input capacitance (SDA) 8 pF CIN Input rise and fall times 6 ns ZEIL Ei (SA0,SA1,SA2) input impedance VIN< 0.3* VDDSPD 30 k ZEIH Ei (SA0,SA1,SA2) input impedance VIN> 0.7* VDDSPD 800 k tSP Pulse width ignored (input filter on SCL and SDA) Single glitch, f < 100 KHz 100 ns Single glitch, f> 100 KHz 50 |
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