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TS3000GB0A0 Datasheet(PDF) 4 Page - Integrated Device Technology |
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TS3000GB0A0 Datasheet(HTML) 4 Page - Integrated Device Technology |
4 / 25 page 4 of 25 November 4, 2014 IDT AC Measurement Conditions AC Measurement I/O Waveform Input Parameters for the TS3000GB0A0 1.TA=25°C, f=400 kHz 2.Verified by design and characterization not necessarily tested on all devices Symbol Parameter Min. Max. Units CL Load capacitance 100 pF Input rise and fall times 50 ns Input levels 0.2*VDD to 0.8*VDD V Input and output timing reference levels 0.3*VDDto 0.7*VDD V Symbol Parameter1,2 Test Condition Min. Max. Units CIN Input capacitance (SDA) 8 pF CIN Input rise and fall times 6 ns ZEIL Ei (SA0,SA1,SA2) input impedance VIN< 0.3* VDD 30 k ZEIH Ei (SA0,SA1,SA2) input impedance VIN> 0.7* VDD 800 k tSP Pulse width ignored (input filter on SCL and SDA) Single glitch, f < 100 KHz 100 ns Single glitch, f> 100 KHz 50 |
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