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LMH6642Q-Q1 Datasheet(PDF) 7 Page - Texas Instruments |
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LMH6642Q-Q1 Datasheet(HTML) 7 Page - Texas Instruments |
7 / 33 page LMH6642Q-Q1, LMH6643Q-Q1 www.ti.com SNOSC61C – JANUARY 2012 – REVISED SEPTEMBER 2014 7.6 5V Electrical Characteristics Unless otherwise specified, all limits ensured for V + = 5V, V− = 0V, V CM = VO = V +/2, V ID (input differential voltage) as noted (where applicable) and RL = 2kΩ to V +/2. Boldface limits apply at the temperature extremes. PARAMETER TEST CONDITIONS MIN(1) TYP(2) MAX(1) UNIT BW −3dB BW AV = +1, VOUT = 200mVPP 90 120 MHz AV = +2, −1, VOUT = 200mVPP 46 BW0.1dB 0.1dB Gain Flatness AV = +2, RL = 150Ω to V+/2, MHz 15 Rf = 402Ω, VOUT = 200mVPP PBW Full Power Bandwidth AV = +1, −1dB, VOUT = 2VPP 22 MHz en Input-Referred Voltage Noise f = 100kHz 17 nV/ √Hz f = 1kHz 48 in Input-Referred Current Noise f = 100kHz 0.90 pA/ √Hz f = 1kHz 3.3 THD Total Harmonic Distortion f = 5MHz, VO = 2VPP, AV = +2 −60 dBc DG Differential Gain NTSC, AV = +2 0.16% RL =150Ω to V +/2 RL = 1kΩ to V +/2 0.05% DP Differential Phase NTSC, AV = +2 0.05 RL = 150Ω to V +/2 deg RL = 1kΩ to V +/2 0.01 CT Rej. Cross-Talk Rejection f = 5MHz, Receiver: 47 dB Rf = Rg = 510Ω, AV = +2 TS Settling Time VO = 2VPP, ±0.1%, 8pF Load 68 ns SR Slew Rate (3) AV = −1, VI = 2VPP 95 125 V/µs VOS Input Offset Voltage For LMH6642 ±5 ±1 ±7 mV For LMH6643 ±3.4 ±1 ±7 TC VOS Input Offset Average Drift (4) ±5 µV/°C IB Input Bias Current (5) −2.60 −1.70 µA −3.25 IOS Input Offset Current 800 20 nA 1000 RIN Common Mode Input Resistance 3 M Ω CIN Common Mode Input pF 2 Capacitance CMVR Input Common-Mode Voltage CMRR ≥ 50dB −0.2 −0.5 Range −0.1 V 3.8 4.0 3.6 CMRR Common Mode Rejection Ratio VCM Stepped from 0V to 3.5V 72 95 dB AVOL Large Signal Voltage Gain VO = 0.5V to 4.50V 86 98 RL = 2kΩ to V +/2 82 dB VO = 0.5V to 4.25V 76 82 RL = 150Ω to V +/2 72 VO Output Swing RL = 2kΩ to V +/2, V ID = 200mV 4.90 4.98 V High RL = 150Ω to V +/2, V ID = 200mV 4.65 4.90 Output Swing RL = 2kΩ to V +/2, V ID = −200mV 25 100 mV Low RL = 150Ω to V +/2, V ID = −200mV 100 150 (1) All limits are ensured by testing or statistical analysis. (2) Typical values represent the most likely parametric norm. (3) Slew rate is the average of the rising and falling slew rates. (4) Offset voltage average drift determined by dividing the change in VOS at temperature extremes by the total temperature change. (5) Positive current corresponds to current flowing into the device. Copyright © 2012–2014, Texas Instruments Incorporated Submit Documentation Feedback 7 Product Folder Links: LMH6642Q-Q1 LMH6643Q-Q1 |
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