3

Gain at 30 GHz

P-1dB at 30 GHz

Typical distribution of Small Signal Gain and Output Power @P-1dB. Based on 1500 part sampled over several produc-

tion lots.

P-1dB at 38 GHz

LSL

18

19

20

LSL

22.6 22.7 22.8 22.9 23 23.1 23.2 23.3 23.4

LSL

23

24

MTTF vs. Tchannel Temperature

Operation

60% Confidence Level

90% Confidence Level

Point Data R=

Tj

λ (ФIT)

MTTF (hrs)

λ (ФIT)

MTTF (hrs)

λ (ФIT)

MTTF (Yrs)

150

3511

2.8E+05

8822

1.1E+05

3831

2.6E+05

140

1298

7.7E+05

3260

3.1E+05

1416

7.1E+05

130

456

2.2E+06

1147

8.7E+05

498

2.0E+05

120

152

6.6E+06

382

2.6E+06

166

6.0E+06

110

48

2.1E+07

120

8.3E+06

52

1.9E+06

100

14

7.0E+07

36

2.8E+07

15

6.5E+07

90

4

2.5E+08

10

1.0E+08

4

2.3E+08

80

1

9.9E+08

3

3.9E+08

1

9.1E+08

70

0

4.2E+09

1

1.7E+09

0

3.8E+09

60

0

1.9E+10

0

7.6E+09

0

1.7E+10

50

0

9.6E+10

0

3.8E+10

0

8.8E+10

:)

Symbol

Parameters and Test Conditions

Units

Minimum

Typical

Maximum

Sigma

Gain

dB

18

0.28

Output Power at 1dB Gain Compression

dBm

22.5

24

0.20

Output Power at 3dB Gain Compression

dBm

25

0.17

OIP3

Third Order Intercept Point;

'f=100MHz; Pin=-20dBm

dBm

32

0.8

RLin

dB

-17

0.92

RLout

dB

-13

0.63

Isolation

Min. Reverse Isolation

dB

-40

1.30

Notes:

2. 100% on-wafer RF test is done at frequency = 25, 30, and 38 GHz. Statistics based on 1500 part sample