4

MGA-62563 Electrical Specifications

Symbol

Parameters and Test Conditions

Freq

Units

Min.

Typ.

Max.

Std Dev

Device Current

mA

47

62

77

2.09

f = 0.5 GHz

dB

0.93

1.4

0.06

f = 0.5 GHz

dB

20.4

22

23.4

0.36

f = 0.5 GHz

dBm

30

32.9

0.51

Noise Figure in 50

 system

f = 0.1 GHz

dB

1.1

f = 0.2 GHz

1.0

f = 0.5 GHz

0.8

f = 1.0 GHz

0.9

0.06

f = 1.5 GHz

1.0

f = 2.0 GHz

1.2

f = 2.5 GHz

1.3

f = 3.0 GHz

1.5

Associated Gain in 50

 system

f = 0.1 GHz

dB

23.5

f = 0.2 GHz

23

f = 0.5 GHz

22

f = 1.0 GHz

20

0.36

f = 1.5 GHz

17

f = 2.0 GHz

15.5

f = 2.5 GHz

14

f = 3.0 GHz

13

 system f = 0.1 GHz

dBm

34.7

f = 0.2 GHz

34.7

f = 0.5 GHz

34.8

f = 1.0 GHz

33.5

0.51

f = 1.5 GHz

33

f = 2.0 GHz

32.3

f = 2.5 GHz

32

f = 3.0 GHz

31

Output Power at 1dB Gain Compression in 50

 system

f = 0.1 GHz

dBm

18

f = 0.2 GHz

18

f =0.5 GHz

18

f = 1.0 GHz

17.6

f = 1.5 GHz

17.6

f = 2.0 GHz

17.7

f = 2.5 GHz

17.9

f = 3.0 GHz

17.7

Notes:

1. Guaranteed specifications are 100% tested in the production test circuit as shown in Figure 1, the typical value is based on measurement of at

least 500 parts from three non-consecutive wafer lots during initial characterization of this product.

2. Circuit achieved a trade-off between optimal NF, Gain, OIP3 and input return loss.

3. Parameter quoted at 50

 is based on measurement of selected typical parts tested on a 50 input and output test fixture.