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SCP51460SN33T1G Datasheet(PDF) 3 Page - ON Semiconductor |
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SCP51460SN33T1G Datasheet(HTML) 3 Page - ON Semiconductor |
3 / 6 page SCP51460 http://onsemi.com 3 Quiescent Current IOUT = 0 mA, TA = 25°C IOUT = 0 mA, 0°C ≤ TA ≤ 100°C IQ − − 150 180 220 mA Output Short Circuit Current VOUT = 0 V, TA = 25°C ISC − 40 − mA Reverse Leakage VIN = − 15 V, TA = 25°C ILEAK − 0.1 10 mA Output Noise Voltage (Note 7) f = 0.1 Hz to 10 Hz f = 10 Hz to 1 kHz VN − 13.2 13.2 − mVPP mVrms 6. Performance guaranteed over the indicated operating temperature range by design and/or characterization tested at TJ = TA = 25°C. Low duty cycle pulse techniques are used during testing to maintain the junction temperature as close to ambient as possible. 7. Peak−to−peak noise is measured with a single pole high pass filter at 0.1 Hz and 2−pole low pass filter at 10 Hz. The unit is enclosed into still−air environment to eliminate thermocouple effects. The test time is set to 10 sec. TYPICAL CHARACTERISTICS Figure 2. Output Voltage vs. Temperature Figure 3. Quiescent Current vs. Input Voltage TEMPERATURE (°C) INPUT VOLTAGE (V) 100 80 20 0 −20 −40 3.27 3.28 3.29 3.30 3.32 3.33 20 15 10 7.5 5.0 2.5 0 0 50 100 150 250 300 400 450 3 TYPICAL PARTS 100°C 200 350 25°C −40°C 12.5 17.5 40 60 120 140 3.31 |
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