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MUR880EG Datasheet(PDF) 4 Page - ON Semiconductor |
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MUR880EG Datasheet(HTML) 4 Page - ON Semiconductor |
4 / 6 page MUR8100E, MUR880E http://onsemi.com 4 t0 t1 t2 t VDD ID IL BVDUT MERCURY SWITCH Figure 6. Test Circuit Figure 7. Current−Voltage Waveforms +VDD DUT 40 mH COIL VD IL S1 ID The unclamped inductive switching circuit shown in Figure 6 was used to demonstrate the controlled avalanche capability of the new “E’’ series Ultrafast rectifiers. A mercury switch was used instead of an electronic switch to simulate a noisy environment when the switch was being opened. When S1 is closed at t0 the current in the inductor IL ramps up linearly; and energy is stored in the coil. At t1 the switch is opened and the voltage across the diode under test begins to rise rapidly, due to di/dt effects, when this induced voltage reaches the breakdown voltage of the diode, it is clamped at BVDUT and the diode begins to conduct the full load current which now starts to decay linearly through the diode, and goes to zero at t2. By solving the loop equation at the point in time when S1 is opened; and calculating the energy that is transferred to the diode it can be shown that the total energy transferred is equal to the energy stored in the inductor plus a finite amount of energy from the VDD power supply while the diode is in breakdown (from t1 to t2) minus any losses due to finite component resistances. Assuming the component resistive elements are small Equation (1) approximates the total energy transferred to the diode. It can be seen from this equation that if the VDD voltage is low compared to the breakdown voltage of the device, the amount of energy contributed by the supply during breakdown is small and the total energy can be assumed to be nearly equal to the energy stored in the coil during the time when S1 was closed, Equation (2). The oscilloscope picture in Figure 8, shows the MUR8100E in this test circuit conducting a peak current of one ampere at a breakdown voltage of 1300 V, and using Equation (2) the energy absorbed by the MUR8100E is approximately 20 mjoules. Although it is not recommended to design for this condition, the new “E’’ series provides added protection against those unforeseen transient viruses that can produce unexplained random failures in unfriendly environments. WAVAL [ 1 2 LI 2 LPK BVDUT BVDUTVDD WAVAL [ 1 2 LI 2 LPK Figure 8. Current−Voltage Waveforms CHANNEL 2: IL 0.5 AMPS/DIV. CHANNEL 1: VDUT 500 VOLTS/DIV. TIME BASE: 20 ms/DIV. EQUATION (1): EQUATION (2): CH1 CH2 REF REF CH1 CH2 ACQUISITIONS SAVEREF SOURCE 1 217:33 HRS STACK A 20ms 953 V VERT 500V 50mV |
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