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LTC3886 Datasheet(PDF) 9 Page - Linear Technology |
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LTC3886 Datasheet(HTML) 9 Page - Linear Technology |
9 / 116 page LTC3886 9 3886f For more information www.linear.com/LTC3886 elecTrical characTerisTics The l denotes the specifications which apply over the specified operating junction temperature range, otherwise specifications are at TJ = 25°C (Note 2). VIN = 16V, EXTVCC = 0V, VRUN0 = 3.3V, VRUN1 = 3.3V fSYNC = 350kHz (externally driven), and all programmable parameters at factory default unless otherwise specified. Note 1: Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to any Absolute Maximum Rating condition for extended periods may affect device reliability and lifetime. Note 2: The LTC3886 is tested under pulsed load conditions such that TJ ≈ TA. The LTC3886E is guaranteed to meet performance specifications from 0°C to 85°C. Specifications over the –40°C to 125°C operating junction temperature range are assured by design, characterization and correlation with statistical process controls. The LTC3886I is guaranteed over the –40°C to 125°C operating junction temperature range. TJ is calculated from the ambient temperature, TA, and power dissipation, PD, according to the following formula: TJ = TA + (PD • θJA) The maximum ambient temperature consistent with these specifications is determined by specific operating conditions in conjunction with board layout, the rated package thermal impedance and other environmental factors. Note 3: All currents into device pins are positive; all currents out of device pins are negative. All voltages are referenced to ground unless otherwise specified. Note 4: Rise and fall times are measured using 10% and 90% levels. Delay times are measured using 50% levels. Note 5: The data format in PMBus is 5 bits exponent (signed) and 11 bits mantissa (signed). This limits the output resolution to 10 bits though the internal ADC is 16 bits and the calculations use 32-bit words. Note 6: The data conversion is done in round robin fashion. All inputs signals are continuously converted for a typical latency of 100ms. Note 7: The IOUT_CAL_GAIN = 1.0mΩ and MFR_IOUT_TC = 0.0. Value as read from READ_IOUT in amperes. Note 8: Part tested with PWM disabled. Evaluation in application demonstrates capability. TUE (%) = ADC Gain Error (%) + 100 • [Zero Code Offset + ADC Linearity Error]/Actual Value. Note 9: All VOUT commands assume the ADC is used to auto-zero the output to achieve the stated accuracy. LTC3886 is tested in a feedback loop that servos VOUT to a specified value. Note 10: The maximum programmable VOUT voltage is 13.8V. Note 11: The maximum VIN voltage is 60V. Note 12: When VIN < 6V, INTVCC must be tied to VIN. Note 13: EEPROM endurance is guaranteed by design, characterization and correlation with statistical process controls. Data retention is production tested via a high temperature bake at wafer level.The minimum retention specification applies for devices whose EEPROM has been cycled less than the minimum endurance specification. The RESTORE_USER_ALL command (EEPROM read) is valid over the entire operating temperature range. Note 14: The LTC3886 quiescent current (IQ) equals the IQ of VIN plus the IQ of EXTVCC. Note 15: The LTC3886 includes overtemperature protection that is intended to protect the device during momentary overload conditions. Junction temperature will exceed 125°C when overtemperature protection is active. Continuous operation above the specified maximum operating junction temperature may impair device reliability. Note 16: Write operations above TJ = 85°C or below 0°C are possible although the Electrical Characteristics are not guaranteed and the EEPROM will be degraded. Read operations performed at temperatures between –40°C and 125°C will not degrade the EEPROM. Writing to the EEPROM above 85°C will result in a degradation of retention characteristics. Note 17: Limits guaranteed by TSNS voltage and current measurements during test, including ADC readback. SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS tSU,DAT Data Setup Time Receiving Data l 0.1 µs tTIMEOUT_SMB Stuck PMBus Timer Non-Block Reads Stuck PMBus Timer Block Reads Measured from the Last PMBus Start Event 32/255 255 ms ms tLOW Serial Clock Low Period l 1.3 10000 µs tHIGH Serial Clock High Period l 0.6 µs |
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