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LTC3886 Datasheet(PDF) 9 Page - Linear Technology

Part # LTC3886
Description  60V Dual Output Step-Down Controller with Digital Power System Management
Download  116 Pages
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Manufacturer  LINER [Linear Technology]
Direct Link  http://www.linear.com
Logo LINER - Linear Technology

LTC3886 Datasheet(HTML) 9 Page - Linear Technology

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LTC3886
9
3886f
For more information www.linear.com/LTC3886
elecTrical characTerisTics The
l
denotes the specifications which apply over the specified operating
junction temperature range, otherwise specifications are at TJ = 25°C (Note 2). VIN = 16V, EXTVCC = 0V, VRUN0 = 3.3V, VRUN1 = 3.3V
fSYNC = 350kHz (externally driven), and all programmable parameters at factory default unless otherwise specified.
Note 1: Stresses beyond those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Exposure to any Absolute
Maximum Rating condition for extended periods may affect device
reliability and lifetime.
Note 2: The LTC3886 is tested under pulsed load conditions such that TJ
TA. The LTC3886E is guaranteed to meet performance specifications from
0°C to 85°C. Specifications over the –40°C to 125°C operating junction
temperature range are assured by design, characterization and correlation
with statistical process controls. The LTC3886I is guaranteed over the
–40°C to 125°C operating junction temperature range. TJ is calculated from
the ambient temperature, TA, and power dissipation, PD, according to the
following formula:
TJ = TA + (PD • θJA)
The maximum ambient temperature consistent with these specifications
is determined by specific operating conditions in conjunction with board
layout, the rated package thermal impedance and other environmental
factors.
Note 3: All currents into device pins are positive; all currents out of device
pins are negative. All voltages are referenced to ground unless otherwise
specified.
Note 4: Rise and fall times are measured using 10% and 90% levels. Delay
times are measured using 50% levels.
Note 5: The data format in PMBus is 5 bits exponent (signed) and 11 bits
mantissa (signed). This limits the output resolution to 10 bits though the
internal ADC is 16 bits and the calculations use 32-bit words.
Note 6: The data conversion is done in round robin fashion. All inputs
signals are continuously converted for a typical latency of 100ms.
Note 7: The IOUT_CAL_GAIN = 1.0mΩ and MFR_IOUT_TC = 0.0. Value as
read from READ_IOUT in amperes.
Note 8: Part tested with PWM disabled. Evaluation in application
demonstrates capability. TUE (%) = ADC Gain Error (%) + 100 •
[Zero Code Offset + ADC Linearity Error]/Actual Value.
Note 9: All VOUT commands assume the ADC is used to auto-zero the
output to achieve the stated accuracy. LTC3886 is tested in a feedback
loop that servos VOUT to a specified value.
Note 10: The maximum programmable VOUT voltage is 13.8V.
Note 11: The maximum VIN voltage is 60V.
Note 12: When VIN < 6V, INTVCC must be tied to VIN.
Note 13: EEPROM endurance is guaranteed by design, characterization
and correlation with statistical process controls. Data retention is
production tested via a high temperature bake at wafer level.The minimum
retention specification applies for devices whose EEPROM has been cycled
less than the minimum endurance specification. The RESTORE_USER_ALL
command (EEPROM read) is valid over the entire operating temperature
range.
Note 14: The LTC3886 quiescent current (IQ) equals the IQ of VIN plus the
IQ of EXTVCC.
Note 15: The LTC3886 includes overtemperature protection that is
intended to protect the device during momentary overload conditions.
Junction temperature will exceed 125°C when overtemperature protection
is active. Continuous operation above the specified maximum operating
junction temperature may impair device reliability.
Note 16: Write operations above TJ = 85°C or below 0°C are possible
although the Electrical Characteristics are not guaranteed and the EEPROM
will be degraded. Read operations performed at temperatures between
–40°C and 125°C will not degrade the EEPROM. Writing to the EEPROM
above 85°C will result in a degradation of retention characteristics.
Note 17: Limits guaranteed by TSNS voltage and current measurements
during test, including ADC readback.
SYMBOL
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNITS
tSU,DAT
Data Setup Time
Receiving Data
l
0.1
µs
tTIMEOUT_SMB Stuck PMBus Timer Non-Block Reads
Stuck PMBus Timer Block Reads
Measured from the Last PMBus Start Event
32/255
255
ms
ms
tLOW
Serial Clock Low Period
l
1.3
10000
µs
tHIGH
Serial Clock High Period
l
0.6
µs


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