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UPD75P3036GC-3B9 Datasheet(PDF) 1 Page - NEC |
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UPD75P3036GC-3B9 Datasheet(HTML) 1 Page - NEC |
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1 / 64 page  © 1996 DATA SHEET µPD75P3036 MOS INTEGRATED CIRCUIT 4-BIT SINGLE-CHIP MICROCONTROLLER The µPD75P3036 replaces the µPD753036’s internal mask ROM with a one-time PROM or EPROM. Because the µPD75P3036 supports programming by users, it is suitable for use in prototype testing for system development using the µPD753036 and for use in small-scale production. Caution The µPD75P3036KK-T is not designed to guarantee the reliability required for use in mass- production. Please use it only for performance evaluation during testing and test production runs. Detailed descriptions of functions are provided in the following document. Be sure to read the document before designing. µPD753036 User’s Manual : U10201E FEATURES • Compatible with µPD753036 • Internal PROM: 16384 × 8 bits • µPD75P3036KK-T : Reprogrammable (ideally suited for system evaluation) • µPD75P3036GC, 75P3036GK : One-time programmable (ideally suited for small-scale production) • Internal RAM: 768 × 4 bits • Can operate in the same power supply voltage as the mask version µPD753036 •VDD = 1.8 to 5.5 V • LCD controller/driver • A/D converter Caution Mask-option pull-up resistors are not provided in this device. ORDERING INFORMATION Part Number Package Internal PROM Quality Grade µPD75P3036GC-3B9 80-pin plastic QFP One-time PROM Standard (14 × 14 mm, 0.65-mm pitch) µPD75P3036GK-BE9 80-pin plastic TQFP One-time PROM Standard (fine pitch) (12 × 12 mm, 0.5-mm pitch) µPD75P3036KK-T 80-pin ceramic WQFN EPROM Not applicable Document No. U11575EJ1V0DS00 (1st edition) (Previous No. IP-3657) Date Published November 1996 P Printed in Japan The information in this document is subject to change without notice. In this document, the term PROM is used in parts common to one-time PROM versions and EPROM versions. * * Please refer to "Quality Grades on NEC Semiconductor Devices" (Document No. C11531E) published by NEC Corporation to know the specification of quality grade on the devices and its recommended applications. The mark shows major revised points. * |
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