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IRHNA9160 Datasheet(PDF) 1 Page - International Rectifier |
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IRHNA9160 Datasheet(HTML) 1 Page - International Rectifier |
1 / 4 page Product Summary Part Number BVDSS RDS(on) ID IRHNA9160 -100V 0.087 Ω -38A Features: s Radiation Hardened up to 1 x 105 Rads (Si) s Single Event Burnout (SEB) Hardened s Single Event Gate Rupture (SEGR) Hardened s Gamma Dot (Flash X-Ray) Hardened s Neutron Tolerant s Identical Pre- and Post-ElectricalTest Conditions s Repetitive Avalanche Rating s Dynamic dv/dt Rating s Simple Drive Requirements s Ease of Paralleling s Hermetically Sealed s Surface Mount s Lightweight Absolute Maximum Ratings Parameter IRHNA9160 Units ID @ VGS = -12V, TC = 25 oC Continuous Drain Current -38 ID @ VGS = -12V, TC = 100 oC Continuous Drain Current -24 IDM Pulsed Drain Current -152 PD @ TC = 25 oC Max. Power Dissipation 300 W Linear Derating Factor 2.4 W/K VGS Gate-to-SourceVoltage ±20 V EAS Single Pulse Avalanche Energy 500 mJ IAR Avalanche Current -38 A EAR Repetitive Avalanche Energy 30 mJ dv/dt Peak Diode Recovery dv/dt -5.5 V/ns TJ Operating Junction -55 to 150 TSTG StorageTemperature Range Package Mounting Surface Temperature 300 (for 5 sec.) Weight 3.3 (typical) g P-CHANNEL RAD HARD Provisional Data Sheet No. PD-9.1433 Pre-Radiation -100Volt, 0.087 Ω Ω Ω Ω Ω, RAD HARD HEXFET International Rectifier’s P-Channel RAD HARD technology HEXFETs demonstrate excellent threshold voltage stability and breakdown voltage stability at total radiation doses as high as 105 rads (Si). Under identical pre- and post-radiation test conditions, International Rectifier’s P-Channel RAD HARD HEXFETs retain identical electrical specifications up to 1 x 105 Rads (Si) total dose. No compensation in gate drive circuitry is required. These devices are also capable of surviving transient ionization pulses as high as 1 x 1012 Rads (Si)/Sec, and return to normal operation within a few micro- seconds. Single Event Effect (SEE) testing of International Rectifier’s P-Channel RAD HARD HEXFETs has demon- strated virtual immunity to SEE failure. Since the RAD HARD process utilizes International Rectifier’s patented HEXFET technology, the user can expect the highest quality and reli- ability in the industry. P- Channel RAD HARD HEXFET transistors also feature all of the well-established advantages of MOSFETs, such as voltage control, very fast switching, ease of paralleling and temperature stability of the electrical parameters. They are well-suited for applications such as switching power sup- plies, motor controls, inverters, choppers, audio amplifiers and high-energy pulse circuits in space and weapons envi- ronments. o C A IRHNA9160 REPETITIVE AVALANCHE AND dv/dt RATED HEXFET® TRANSISTOR Next Data Sheet Index Previous Datasheet To Order |
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