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HI5860 Datasheet(PDF) 8 Page - Intersil Corporation |
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HI5860 Datasheet(HTML) 8 Page - Intersil Corporation |
8 / 12 page 8 Definition of Specifications Differential Linearity Error, DNL, is the measure of the step size output deviation from code to code. Ideally the step size should be 1 LSB. A DNL specification of 1 LSB or less guarantees monotonicity. Full Scale Gain Drift, is measured by setting the data inputs to be all logic high (all 1s) and measuring the output voltage through a known resistance as the temperature is varied from TMIN to TMAX. It is defined as the maximum deviation from the value measured at room temperature to the value measured at either TMIN or TMAX. The units are ppm of FSR (full scale range) per oC. Full Scale Gain Error, is the error from an ideal ratio of 32 between the output current and the full scale adjust current (through RSET). Integral Linearity Error, INL, is the measure of the worst case point that deviates from a best fit straight line of data values along the transfer curve. Internal Reference Voltage Drift, is defined as the maximum deviation from the value measured at room temperature to the value measured at either TMIN or TMAX. The units are ppm per oC. Offset Drift, is measured by setting the data inputs to all logic low (all 0s) and measuring the output voltage through a known resistance as the temperature is varied from TMIN to TMAX. It is defined as the maximum deviation from the value measured at room temperature to the value measured at either TMIN or TMAX. The units are ppm of FSR (full scale range) per degree oC. Offset Error, is measured by setting the data inputs to all logic low (all 0s) and measuring the output voltage through a known resistance. Offset error is defined as the maximum deviation of the output current from a value of 0mA. Output Settling Time, is the time required for the output voltage to settle to within a specified error band measured from the beginning of the output transition. The measurement is done by switching quarter scale. Termination impedance was 25 Ω due to the parallel resistance of the 50 Ω loading on the output and the oscilloscope’s 50 Ω input. This also aids the ability to resolve the specified error band without overdriving the oscilloscope. Output Voltage Compliance Range, is the voltage limit imposed on the output. The output impedance should be chosen such that the voltage developed does not violate the compliance range. Power Supply Rejection, is measured using a single power supply. The supply’s nominal +5V is varied ±10% and the change in the DAC full scale output is noted. Reference Input Multiplying Bandwidth, is defined as the 3dB bandwidth of the voltage reference input. It is measured by using a sinusoidal waveform as the external reference with the digital inputs set to all 1s. The frequency is increased until the amplitude of the output waveform is 0.707 (-3dB) of its original value. Singlet Glitch Area, is the switching transient appearing on the output during a code transition. It is measured as the area under the overshoot portion of the curve and is expressed as a Volt-Time specification. This is tested using a single code transition across a major current source. Spurious Free Dynamic Range, SFDR, is the amplitude difference from the fundamental signal to the largest harmonically or non-harmonically related spur within the specified frequency window. Total Harmonic Distortion, THD, is the ratio of the RMS value of the fundamental output signal to the RMS sum of the first five harmonic components. Detailed Description The HI5860 is an 12-bit, current out, CMOS, digital to analog converter. Its maximum update rate is 125+MSPS and can be powered by either single or dual power supplies in the recommended range of +3V to +5V. Operation with clock rates higher than 125MSPS is possible; please contact the factory for more information. It consumes less than 180mW of power when using a +5V supply with the data switching at 125MSPS. The architecture is based on a segmented current source arrangement that reduces glitch by reducing the amount of current switching at any one time. In previous architectures that contained all binary weighted current sources or a binary weighted resistor ladder, the converter might have a substantially larger amount of current turning on and off at certain, worst-case transition points such as midscale and quarter scale transitions. By greatly reducing the amount of current switching at certain “major” transitions, the overall glitch of the converter is dramatically reduced, improving settling time, transient problems, and accuracy. Digital Inputs and Termination The HI5860 digital inputs are guaranteed to CMOS levels. However, TTL compatibility can be achieved by lowering the supply voltage to 3V due to the digital threshold of the input buffer being approximately half of the supply voltage. The internal register is updated on the rising edge of the clock. To minimize reflections, proper termination should be implemented. If the lines driving the clock and the digital inputs are long 50 Ω lines, then 50Ω termination resistors should be placed as close to the converter inputs as possible connected to the digital ground plane (if separate grounds are used). These termination resistors are not likely needed as long as the digital waveform source is within a few inches of the DAC. Ground Planes Separate digital and analog ground planes should be used. All of the digital functions of the device and their HI5860 |
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