265

Specifications HCS190MS

TABLE 6. APPLICABLE SUBGROUPS

CONFORMANCE GROUPS

METHOD

GROUP A SUBGROUPS

READ AND RECORD

Initial Test (Preburn-In)

100%/5004

1, 7, 9

ICC, IOL/H, IOZL/H

Interim Test I (Postburn-In)

100%/5004

1, 7, 9

ICC, IOL/H, IOZL/H

Interim Test II (Postburn-In)

100%/5004

1, 7, 9

ICC, IOL/H, IOZL/H

PDA

100%/5004

1, 7, 9, Deltas

Interim Test III (Postburn-In)

100%/5004

1, 7, 9

ICC, IOL/H, IOZL/H

PDA

100%/5004

1, 7, 9, Deltas

Final Test

100%/5004

2, 3, 8A, 8B, 10, 11

Group A (Note 1)

Sample/5005

1, 2, 3, 7, 8A, 8B, 9, 10, 11

Group B

Subgroup B-5

Sample/5005

1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas

Subgroups 1, 2, 3, 9, 10, 11

Subgroup B-6

Sample/5005

1, 7, 9

Group D

Sample/5005

1, 7, 9

NOTE:

1. Alternate group A testing in accordance with Method 5005 of Mil-Std-883 may be exercised.

TABLE 7. TOTAL DOSE IRRADIATION

CONFORMANCE

GROUPS

METHOD

TEST

READ AND RECORD

PRE RAD

POST RAD

PRE RAD

POST RAD

Group E Subgroup 2

5005

1, 7, 9

Table 4

1, 7, 9

Table 4 (Note 1)

NOTE:

1. Except FN test which will be performed 100% go/no-go.

TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS

OPEN

GROUND

1/2 VCC = 3V

± 0.5V

VCC = 6V

± 0.5V

OSCILLATOR

50kHz

25kHz

STATIC I BURN-IN (Note 1)

2, 3, 6, 7, 12, 13

1, 4, 5, 8, 9, 10,

11, 14, 15

-16

-

-

STATIC II BURN-IN (Note 1)

2, 3, 6, 7, 12, 13

8

-

1, 4, 5, 9, 10, 11, 14,

15, 16

--

DYNAMIC BURN-IN (Note 2)

-

1, 4, 5, 8, 9, 10, 15

2, 3, 6, 7, 12, 13

11, 16

14

-

NOTES:

1. Each pin except VCC and GND will have a series resistor of 10K

± 5%.

2. Each pin except VCC and GND will have a series resistor of 1K

± 5%.

TABLE 9. IRRADIATION TEST CONNECTIONS

OPEN

GROUND

VCC = 5V

± 0.5V

2, 3, 6, 7, 12, 13

8

1, 4, 5, 9, 10, 11, 14, 15, 16

NOTE: Each pin except VCC and GND will have a resistor of 47K

Ω± 5% for irradiation testing. Group E,

Subgroup 2, sample size is 4 dice/wafer 0 failures.

Spec Number

518836