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7429FCT2053CTQ Datasheet(PDF) 3 Page - Integrated Device Technology |
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7429FCT2053CTQ Datasheet(HTML) 3 Page - Integrated Device Technology |
3 / 8 page IDT29FCT52AT/BT/CT/DT, IDT29FCT/2052AT/BT/CT, IDT29FCT53AT/BT/CT FAST CMOS OCTAL REGISTERED TRANSCEIVERS MILITARY AND COMMERCIAL TEMPERATURE RANGES 6.1 3 NOTE: 1. H = HIGH Voltage Level L = LOW Voltage Level X = Don’t Care NC = No Change ↑ = LOW-to-HIGH Transition REGISTER FUNCTION TABLE (1) (Applies to A or B Register) Inputs Internal DCP CE CE Q Function X X H NC Hold Data L ↑ L L Load Data H ↑ LH 2629 tbl 02 OUTPUT CONTROL (1) Internal Y-Outputs OE OE Q 52/2052 53 Function H X Z Z Disable Outputs L L L H Enable Outputs LH HL NOTE: 2629 tbl 03 1. H = HIGH Voltage Level L = LOW Voltage Level X = Don’t Care Z = High Impedance CAPACITANCE (TA = +25 °C, f = 1.0MHz) ABSOLUTE MAXIMUM RATINGS (1) 2529 lnk 04 Symbol Parameter(1) Conditions Typ. Max. Unit CIN Input Capacitance VIN = 0V 6 10 pF COUT Output Capacitance VOUT = 0V 8 12 pF NOTE: 1. This parameter is measured at characterization but not tested. 2640 lnk 05 Symbol Rating Commercial Military Unit VTERM(2) Terminal Voltage with Respect to GND –0.5 to +7.0 –0.5 to +7.0 V VTERM(3) Terminal Voltage with Respect to GND –0.5 to VCC +0.5 –0.5 to VCC +0.5 V TA Operating Temperature 0 to +70 –55 to +125 °C TBIAS Temperature Under Bias –55 to +125 –65 to +135 °C TSTG Storage Temperature –55 to +125 –65 to +150 °C PT Power Dissipation 0.5 0.5 W IOUT DC Output Current –60 to +120 –60 to +120 mA NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RAT- INGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other condi- tions above those indicated in the operational sections of this specifica- tion is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed VCC by +0.5V unless otherwise noted. 2. Input and VCC terminals only. 3. Outputs and I/O terminals only. |
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