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IDT74FCT521BEB Datasheet(PDF) 2 Page - Integrated Device Technology |
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IDT74FCT521BEB Datasheet(HTML) 2 Page - Integrated Device Technology |
2 / 6 page 2 MILITARYANDCOMMERCIALTEMPERATURERANGES IDT54/74FCT521/A/B/C FAST CMOS 8-BIT IDENTITY COMPARATOR FUNCTION TABLE (1) INPUTS OUTPUT IA = B A, B OA = B L L H H A = B* A ≠ B A = B* A ≠ B L H H H PIN DESCRIPTION Pin Names Description A0 - A7 Word A Inputs B0 - B7 Word B Inputs IA = B Expansion or Enable Input (Active LOW) OA = B Identity Output (Active LOW) NOTE: 1. H = HIGH Voltage Level L = LOW Voltage Level *A0 = B0, A1 = B1, A2 = B2, etc. PIN CONFIGURATION CERDIP/ SOIC/ CERPACK TOP VIEW LCC TOP VIEW 1 2 3 4 5 7 9 6 8 10 11 12 13 14 15 16 17 18 19 20 L20-2 B6 B7 A7 A6 B5 IND EX A1 B1 A3 A2 B2 2 3 1 16 15 14 11 19 18 20 17 13 12 5 6 7 4 D20-1 SO20-2 E20-1 8 9 10 A1 A0 B0 VCC B1 A3 A2 B2 B3 GND OA=B B6 B7 A7 A6 B4 B5 A5 A4 IA=B ABSOLUTE MAXIMUM RATINGS(1) Symbol Rating Commercial Military Unit VTERM(2) Terminal Voltage with Respect to GND –0.5 to +7 –0.5 to +7 V VTERM(3) Terminal Voltage with Respect to GND –0.5 to VCC –0.5 to VCC V TA Operating Temperature 0 to +70 –55 to +125 °C TBIAS Temperature Under Bias –55 to +125 –65 to +135 °C TSTG Storage Temperature –55 to +125 –65 to +150 °C PT Power Dissipation 0.5 0.5 W IOUT DC Output Current 120 120 mA 8-link NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed VCC by +.5V unless otherwise noted. 2. Input and VCC terminals only. 3. Outputs and I/O terminals only. CAPACITANCE (TA = +25OC, f = 1.0MHz) Symbol Parameter(1) Conditions Typ. Max. Unit CIN Input Capacitance VIN = 0V 6 10 pF COUT Output Capacitance VOUT = 0V 8 12 pF 8-link NOTE: 1. This parameter is measured at characterization but not tested. |
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