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IDT74FCT162511ATEB Datasheet(PDF) 1 Page - Integrated Device Technology

Part # IDT74FCT162511ATEB
Description  FAST CMOS 16-BIT REGISTERED/LATCHED TRANSCEIVER WITH PARITY
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Manufacturer  IDT [Integrated Device Technology]
Direct Link  http://www.idt.com
Logo IDT - Integrated Device Technology

IDT74FCT162511ATEB Datasheet(HTML) 1 Page - Integrated Device Technology

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MILITARY AND COMMERCIAL TEMPERATURE RANGES
AUGUST 1996
©1996 Integrated Device Technology, Inc.
5.11
DSC–2916/5
Integrated Device Technology, Inc.
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
FAST CMOS 16-BIT
REGISTERED/LATCHED
TRANSCEIVER WITH PARITY
IDT54/74FCT162511AT/CT
FEATURES:
• 0.5 MICRON CMOS Technology
• Typical tsk(o) (Output Skew) < 250ps, clocked mode
• Low input and output leakage
≤1µA (max)
• ESD > 2000V per MIL-STD-883, Method 3015;
> 200V using machine model (C = 200pF, R = 0)
• Packages include 25 mil pitch SSOP, 19.6 mil pitch TSSOP,
15.7 mil pitch TVSOP and 25 mil pitch Cerpack
• Extended commercial range of –40
°C to +85°C
•VCC = 5V
±10%
• Balanced Output Drivers:
±24mA (commercial)
±16mA (military)
• Series current limiting resistors
• Generate/Check, Check/Check modes
• Open drain parity error allows wire-OR
DESCRIPTION:
The FCT162511AT/CT 16-bit registered/latched transceiver
with parity is built using advanced dual metal CMOS technol-
ogy. This high-speed, low-power transceiver combines D-
type latches and D-type flip-flops to allow data flow in transpar-
ent, latched or clocked modes.
The device has a parity
generator/cheker in the A-to-B direction and a parity checker
in the B-to-A direction. Error checking is done at the byte level
with separate parity bits for each byte. Separate error flags
exits for each direction with a single error flag indicating an
error for either byte in the A-to-B direction and a second error
flag indicating an error for either byte in the B-to-A direction.
The parity error flags are open drain outputs which can be tied
together and/or tied with flags from other devices to form a
single error flag or interrupt. The parity error flags are enabled
by the
OExx control pins allowing the designer to disable the
error flag during combinational transitions.
The control pins LEAB, CLKAB and
OEAB control opera-
tion in the A-to-B direction while LEBA, CLKBA and
OEBA
control the B-to-A direction.
GEN/CHK is only for the selection
of A-to-B operation, the B-to-A direction is always in checking
mode. The ODD/
EVEN select is common between the two
directions. Except for the ODD/
EVEN control, independent
operation can be achieved between the two directions by
using the corresponding control lines.
SIMPLIFIED FUNCTIONAL BLOCK DIAGRAM:
GEN/CHK
Latch/
Register
Byte
Parity
Generator/
Checker
Latch/
Register
Byte
Parity
Checking
B0-15
A0-15
PA1,2
PB1,2
PERB
LEAB
CLKAB
OEAB
OEBA
PERA
LEBA
CLKBA
Parity, data
Parity, data
Parity, Data
Data
(Open Drain)
(Open Drain)
Parity
ODD/EVEN
16
18
18
18
2
2916 drw 01
1


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