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IDT74FCT16270ATPAB Datasheet(PDF) 3 Page - Integrated Device Technology |
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IDT74FCT16270ATPAB Datasheet(HTML) 3 Page - Integrated Device Technology |
3 / 9 page IDT54/74FCT162701T/AT FAST CMOS 18-BIT R/W BUFFER MILITARY AND COMMERCIAL TEMPERATURE RANGES 5.15 3 PIN DESCRIPTION ABSOLUTE MAXIMUM RATINGS (1) CAPACITANCE (TA = +25 °C, f = 1.0MHz) 2915 lnk 03 NOTE: 1. This parameter is measured at characterization but not tested. 2915 tbl 01 Symbol Parameter(1) Conditions Typ. Max. Unit CIN Input Capacitance VIN = 0V 3.5 6.0 pF CI/O I/O Capacitance VOUT = 0V 3.5 8.0 pF Pin Names I/O Description A1-18 I/O 18 bit I/O port. B1-18 I/O 18 bit I/O port. CLK I Clock for write path FIFO. Clocks data into FIFO when WCE is low, clocks data out of FIFO when RCE is low. When FIFO is full all further writes to the FIFO are inhibited. When FIFO is empty all reads from the FIFO are inhibited. CLK also resets the FIFO when RESET is low. WCE I Enable pin for FIFO input clock. RCE I Enable pin for FIFO output clock. FF O Write path FIFO full flag. Goes low when FIFO is full. RESET I Synchronous FIFO reset - when low CLK resets the FIFO. The FIFO pointers are initialized to the "empty" condition and FIFO output is forced high (all ones). The FIFO full flag ( FF) will be high immediately after reset. OEAB I Output Enable pin for B port. OEBA I Output Enable pin for A port. LE I Read path latch enable pin. When high, data flows transparently from B port to A port, B data is latched on the falling edge of LE. Symbol Description Max. Unit VTERM(2) Terminal Voltage with Respect to GND –0.5 to +7.0 V VTERM(3) Terminal Voltage with Respect to GND –0.5 to VCC +0.5 V TSTG Storage Temperature –65 to +150 °C IOUT DC Output Current –60 to +120 mA NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RAT- INGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. 2. All device terminals except FCT162XXXT Output and I/O terminals. 3. Output and I/O terminals for FCT162XXXT. 2915 lnk 02 |
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