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IDT6167SA70YB Datasheet(PDF) 5 Page - Integrated Device Technology |
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IDT6167SA70YB Datasheet(HTML) 5 Page - Integrated Device Technology |
5 / 8 page 5.2 5 IDT6167SA/LA CMOS STATIC RAM 16K (16K x 1-BIT) MILITARY AND COMMERCIAL TEMPERATURE RANGES AC TEST CONDITIONS Input Pulse Levels GND to 3.0V Input Rise/Fall Times 5ns Input Timing Reference Levels 1.5V Output Reference Levels 1.5V AC Test Load See Figures 1 and 2 2981 tbl 10 Figure 2. AC Test Load (for tCLZ, tCHZ, tWHZ and tOW) *Includes scope and jig. Figure 1. AC Test Load 2981 drw 04 480 Ω 30pF* 255 Ω DATAOUT 5V 2981 drw 05 480 Ω 5pF* 255 Ω DATAOUT 5V AC ELECTRICAL CHARACTERISTICS (VCC = 5.0V ± 10%, All Temperature Ranges) 6167SA15 6167SA20/25 6167SA35/45 (1) 6167SA55(1)/70(1) 6167LA15 6167LA20/25 6167LA35/45 (1) 6167LA55(1)/70(1) Symbol Parameter Min. Max. Min. Max. Min. Max. Min. Max. Unit Read Cycle tRC Read Cycle Time 15 — 20/25 — 35/45 — 55/70 — ns tAA Address Access Time — 15 — 20/25 — 35/45 — 55/70 ns tACS Chip Select Access Time — 15 — 20/25 — 35/45 — 55/70 ns tCLZ (2) Chip Deselect to Output in Low-Z 3 — 5/5 — 5/5 — 5/5 — ns tCHZ (2) Chip Select to Output in High-Z — 10 — 10/10 — 15/30 — 40/40 ns tOH Output Hold from Address Change 3 — 5/5 — 5/5 — 5/5 — ns tPU (2) Chip Select to Power-Up Time 0 — 0/0 — 0/0 — 0/0 — ns tPD (2) Chip Deselect to Power-Down Time — 15 — 20/25 — 35/45 — 55/70 ns Write Cycle tWC Write Cycle Time 15 — 20/20 — 30/45 — 55/70 — ns tCW Chip Select to End-of-Write 15 — 15/20 — 30/40 — 45/55 — ns tAW Address Valid to End-of-Write 15 — 15/20 — 30/40 — 45/55 — ns tAS Address Set-up Time 0 — 0/0 — 0/0 — 0/0 — ns tWP Write Pulse Width 13 — 15/20 — 30/30 — 35/40 — ns tWR Write Recovery Time 0 — 0/0 — 0/0 — 0/0 — ns tDW Data Valid to End-of-Write 10 — 12/15 — 17/20 — 25/30 — ns tDH Data Hold Time 0 — 0/0 — 0/0 — 0/0 — ns tWHZ (2) Write Enable to Output in High-Z — 7 — 8/8 — 15/30 — 40/40 ns tOW (2) Output Active from End-of-Write 0 — 0/0 — 0/0 — 0/0 — ns NOTES: 2981 tbl 11 1. –55 °C to +125°C temperature range only. Also available: 85ns and 100ns Military devices. 2. This parameter is guaranteed with AC Load (Figure 2) by device characterization, but is not production tested. |
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