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IDT49FCT806 Datasheet(PDF) 3 Page - Integrated Device Technology |
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IDT49FCT806 Datasheet(HTML) 3 Page - Integrated Device Technology |
3 / 7 page IDT49FCT805/806/A FAST CMOS BUFFER/CLOCK DRIVER MILITARY AND COMMERCIAL TEMPERATURE RANGES 9.1 3 ABSOLUTE MAXIMUM RATINGS (1) CAPACITANCE (TA = +25 °C, f = 1.0MHz) NOTE: 1. This parameter is measured at characterization but not tested. 2574 lnk 04 Symbol Parameter(1) Conditions Typ. Max. Unit CIN Input Capacitance VIN = 0V 4.5 6.0 pF COUT Output Capacitance VOUT = 0V 5.5 8.0 pF DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE Following Conditions Apply Unless Otherwise Specified: VLC = 0.2V; VHC = VCC – 0.2V Commercial: TA = 0 °C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10% Symbol Parameter Test Conditions(1) Min. Typ.(2) Max. Unit VIH Input HIGH Level Guaranteed Logic HIGH Level 2.0 — — V VIL Input LOW Level Guaranteed Logic LOW Level — — 0.8 V II H Input HIGH Current(5) VCC = Max. VI = VCC —— ±1 µA II L Input LOW Current(5) VCC = Max. VI = GND —— ±1 µA IOZH Off State (HIGH Z)(5) VCC = Max. VO = VCC —— ±1 µA IOZL Output Current(5) VO = GND —— ±1 µA VIK Clamp Diode Voltage VCC = Min., IIN= –18mA — –0.7 –1.2 V IOS Short Circuit Current VCC = Max.(3), VO = GND –60 –120 — mA VOH Output HIGH Voltage VCC = 3V, VIN = VLC or VHC, IOH = –32 µAVHC VCC —V VCC = Min. IOH = –300 µAVHC VCC — VIN = VIH or VIL IOH = –12mA MIL. IOH = –15mA COM'L. 3.6 4.3 — IOH = -24mA MIL. IOH = -24mA COM'L. 2.4 3.8 — VOL Output LOW Voltage VCC = 3V, VIN = VLC or VHC, IOL= 300 µA — GND VLC V VCC = Min. IOH = 300 µA — GND VLC(4) VIN = VIH or VIL IOL = 48mA MIL. — 0.3 0.55 IOL = 64mA COM'L. VH Input Hysteresis for all inputs — — 200 — mV ICC Quiescent Power Supply Current VCC = Max., VIN = GND or VCC — 5 500 µA NOTES: 2574 tbl 05 1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC = 5.0V, +25 °C ambient. 3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second. 4. This parameter is guaranteed but not tested. 5. The test limit for this parameter is ± 5µA at TA = –55°C. NOTE: 2574 tbl 02 1. H = HIGH, L = LOW, Z = High Impedance FUNCTION TABLE (1) Outputs Inputs 49FCT805 49FCT806 OE OEA, OE OEB INA, INB OAn, OBn MON OA OAn, OB OBn MON MON LLLL H H L HHH L L HL ZL Z H HH ZH Z L Symbol Description Max. Unit VTERM(2) Terminal Voltage with Respect to GND –0.5 to +7.0 V VTERM(3) Terminal Voltage with Respect to GND –0.5 to VCC +0.5 V TSTG Storage Temperature –65 to +150 °C IOUT DC Output Current –60 to +120 mA NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed VCC by +0.5V unless otherwise noted. 2. Input and VCC terminals. 3. Output and I/O terminals. 2574 lnk 03 |
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